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1999, vol.32, no.1	1999, vol.32, no.2	1999, vol.32, no.3	1999, vol.32, no.4	1999, vol.32, no.5	1999, vol.32, no.6
1999, vol.32, no.7	1999, vol.32, no.8

题名	作者	出版年	年卷期
Analysis of eddy currents in a bar containing an embedded defect	J. W. Liaw; S. L. Chu; C. S. Yeh; M. K. Kuo	1999	1999, vol.32, no.5
Fatigue-life prediction of SiC aluminum composite using a weibull model	D. Shan; H. Nayeb-Hashemi	1999	1999, vol.32, no.5
Hydrogen damage detection by ultrasonic spectral analysis	S. E. Kruger; J. M. A. Rebello; P. C. de Camargo	1999	1999, vol.32, no.5
Microwave nondestructive detection of delamination in IC packages utilizing open-ended coaxial line sensor	Y. Ju; M. Saka; H. Abe	1999	1999, vol.32, no.5
NDT data fusion at pixel level	X. E. Gros; J. Bousigue; K. Takahashi	1999	1999, vol.32, no.5
On the NDT and E for the diagnosis of defects using infrared thermography	Terumi Inagaki; Toshimitsu Ishii; Toshikatsu Iwamoto	1999	1999, vol.32, no.5