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2000, vol.33, no.1	2000, vol.33, no.10	2000, vol.33, no.2	2000, vol.33, no.3	2000, vol.33, no.4	2000, vol.33, no.5
2000, vol.33, no.6	2000, vol.33, no.7	2000, vol.33, no.8	2000, vol.33, no.9

题名	作者	出版年	年卷期
Engineering measurement uncertainty: a plea for simplicity	C. J. Parrish	2000	2000, vol.33, no.2
In-process optical measurement of coating thickness	J. S. Barton; J. M. De Freitas; G. Gregory; P. Jennings; A. C. Jones; J. D. C. Jones; J. M. Kilpatrick; F. L. Plows; P. Spencer	2000	2000, vol.33, no.2
International mutual recognition arrangement on calibration and measurement certificates	Andrew Wallard	2000	2000, vol.33, no.2
The incremental motion encoder: a new approach to high-speed monitoring of rotating shafts	Janet F. Poliakoff; Peter D. Thomas; Paul A. Orton; Anthony Sackfield	2000	2000, vol.33, no.2
Weighing in the year 2000	M. J. Buckley	2000	2000, vol.33, no.2