中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0091-3286
刊名Optical Engineering
参考译名光学工程
收藏年代1998～2023



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2022 2023

2000, vol.39, no.1 2000, vol.39, no.10 2000, vol.39, no.11 2000, vol.39, no.12 2000, vol.39, no.2 2000, vol.39, no.3
2000, vol.39, no.4 2000, vol.39, no.5 2000, vol.39, no.6 2000, vol.39, no.7 2000, vol.39, no.8 2000, vol.39, no.9

题名作者出版年年卷期
3-D shape measurement of complex objects by combining photogrammetry and fringe projectionCarsten Reich; Reinhold Ritter; Jan Thesing20002000, vol.39, no.1
Absolute shape measurements using high-resolution optoelectronic holography methodsCosme Furlong; Ryszard J. Pryputniewicz20002000, vol.39, no.1
Absolute three-dimensional shape measurements using coaxial and coimage plane optical systems and Fourier fringe analysis for focus detectionMitsuo Takeda; Takahiro Aoki; Yoko Miyamoto; Hideyuki Tanaka; Ruowei Gu; Zhibo Zhang20002000, vol.39, no.1
Adaptive optical three-dimensional measurement with structured lightRichard Kowarschik; Peter Kuhmstedt; Jorg Gerber; Wolfgang Schreiber; Gunther Notni20002000, vol.39, no.1
Analysis of 3-D surface waviness on standard artifacts by retroreflective metrologyXianzhu Zhang; Walter P. T. North20002000, vol.39, no.1
Application of a liquid sensor based on surface plasma wave excitation to distinguish methyl alcohol from ethyl alcoholYi-Chang Cheng; Wen-Kuan Su; Jiann-Horng Liou20002000, vol.39, no.1
Application of optical shape measurement for the nondestructive evaluation of complex objectsWolfgang Osten20002000, vol.39, no.1
Applying branching processes theory for building a statistical model for scanning electron microscope signalsIra Cohen; Rotem Golan; Stanley R. Rotman20002000, vol.39, no.1
Calibration, parameter estimation, and accuracy enhancement of a four-dimensional imager camera turntable systemXiang Sean Zhou; Ruihua Yin; Wenjian Wang; Xiaogu Wu; William G. Wee20002000, vol.39, no.1
Combination of 3-D deformation and shape measurement by electronic speckle-pattern interferometry for quantitative strain-stress analysisAndreas Ettemeyer20002000, vol.39, no.1
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