中国机械工程学会生产工程分会知识服务平台 | sc.gmachineinfo.com

期刊

全部

2000, vol.2, no.12	2000, vol.67, no.1	2000, vol.67, no.10	2000, vol.67, no.11	2000, vol.67, no.12	2000, vol.67, no.2
2000, vol.67, no.3	2000, vol.67, no.4	2000, vol.67, no.5	2000, vol.67, no.6	2000, vol.67, no.7-8	2000, vol.67, no.9

题名	作者	出版年	年卷期
About several calibrated scanning force microscopes in the PTB	Klaus Hasche; Konrad Herrmann; Werner Mirande; Reiner Seemann; Thomas Ahbe; Hans Buchner	2000	2000, vol.67, no.7-8
Detection of micronewton forces in tribology	M. Scherge; S. I. Ahmed; O. Mollenhauer; F. Spiller	2000	2000, vol.67, no.7-8
Future requirements on micro- and nanomeasurement technique - challenges and approaches	A. Weckenmann; R. Ernst	2000	2000, vol.67, no.7-8
Interferometric calibration procedures of the step-width control of a phase-stepping interferometer	Arnold Nicolaus; Gerhard Bonsch; Chu-Shik Kang	2000	2000, vol.67, no.7-8
Nano measuring machine for zero Abbe offset coordinate-measuring	Gerd Jager; Eberhard Manske; Tino Hausotte; Hans-Joachim Buchner	2000	2000, vol.67, no.7-8
Nano positioning devices - the basis of nano-metrology	Gunter Wilkening	2000	2000, vol.67, no.7-8
Nano-positioning with integrated multi-coordinate drives	Eberhard Kallenbach; Eugen Saffert	2000	2000, vol.67, no.7-8
Wavelets: an introduction for potential users, part 5	Roland Best	2000	2000, vol.67, no.7-8