中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：超导性电子学
收藏年代2000～2024



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2012 2013 2014 2017 2019 2020
2021 2022 2023 2024

2000, vol.100, no.24 2000, vol.100, no.274 2000, vol.100, no.399 2000, vol.100, no.572

题名作者出版年年卷期
Design of phase mode parallel multiplierMasashi Seki; Takeshi Onomi; Koji Nakajima20002000, vol.100, no.572
A single-rail asynchronous full adderYukiyasu Nakamura; Masahiro Sakamoto; Michitada Morisue; Hisato Fujisaka20002000, vol.100, no.572
X-ray detection using superconducting tunnel junction with microstrip-coilT. Taino; H. Nakagawa; M. Aoyagi; H. Akoh; H. Sato; K. Maehata; K. Ishibashi; H. Sato; T. Ikeda; C. Otani; T. Oku; H. Kato; K. Kawai; Y. Takizawa; H. Miyasaka; H. Watanabe; H. M. Shimizu20002000, vol.100, no.572
Design of miniaturized HTS coplanar waveguide bandpass filters with highly packed meanderlinesTatsunori Shinto Youko Koga; Haruichi Kanaya; Keiji Yoshida; Tetsuji Uchiyama; Zhen Wang20002000, vol.100, no.572
Normal-distribution-function-shaped Josephson tunnel junctions for STJ detectorsKatsuya Kikuchi; Takeshi Iizuka; Hiroaki Myoren; Susumu Takada20002000, vol.100, no.572
Influence of thermal cycling on TLF observed in epitaxial NbN/MgO/NbN tunnel junctionsH. Ishida; Y. Takeuchi; A. Saito; A. Kawakami; Z. Wang; K. Hamasaki20002000, vol.100, no.572
Observation of recrystallization process of interface-modified barrier and the properties of interface-modified ramp-edge junctionsY. Ishimaru; Y. Wu; O. Horibe; H. Tano; T. Suzuki; Y. Tarutani; U. Kawabe; K. Tanabe20002000, vol.100, no.572
Fabrication of c-axis oriented YBaCuO trilayer junction with Ar plasma treatmentTakahiro Kaneda; Toshikazu Yamada; Hiroshi Sato; Hiroshi Yamamoto; Hiroshi Akoh20002000, vol.100, no.572
The high J{sub}c large area YBCO film by metalorganic deposition method using trifluoroacetatesTakeshi Araki; SoekBoem Kim; Katsumi Suzuki; Yutaka Yamada; Izumi Hirabayashi20002000, vol.100, no.572
Measurement of surface resistance of large area superconducting filmsM. Kusunoki; M. Mukaida; S. Ohshima; M. Lorenz; H. Hochmuth; D. Natusch; T. Tahrigen20002000, vol.100, no.399
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