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期刊
ISSN
0268-3768
刊名
The International Journal of Advanced Manufacturing Technology
参考译名
先进制造技术国际杂志
收藏年代
1998~2024
全部
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2001, vol.17, no.1
2001, vol.17, no.10
2001, vol.17, no.11
2001, vol.17, no.12
2001, vol.17, no.2
2001, vol.17, no.3
2001, vol.17, no.4
2001, vol.17, no.5
2001, vol.17, no.6
2001, vol.17, no.7
2001, vol.17, no.8
2001, vol.17, no.9
2001, vol.18, no.1
2001, vol.18, no.10
2001, vol.18, no.11
2001, vol.18, no.12
2001, vol.18, no.2
2001, vol.18, no.3
2001, vol.18, no.4
2001, vol.18, no.5
2001, vol.18, no.6
2001, vol.18, no.7
2001, vol.18, no.8
2001, vol.18, no.9
题名
作者
出版年
年卷期
On the hole quality and drill wandering relationship
Z. Katz; A. Poustie
2001
2001, vol.17, no.4
Cutting fluid aerosol from splash in turning: analysis for environmentally conscious machining
A. Atmadi; D. A. Stephenson; S. Y. Liang
2001
2001, vol.17, no.4
An investigation of the wear mechanisms of polycrystalline cubic boron nitride (PCBN) tools when end milling hardened steels at low/medium cutting speeds
A. Braghini, Jr. and R. T. Coelho
2001
2001, vol.17, no.4
Reduction of air-grinding time using collaboration of dual sensors
Sun Ho Kim; Tae Jo Ko; Jung Hwan Ahn
2001
2001, vol.17, no.4
Theoretical tolerance stackup analysis based on tolerance zone analysis
E. E. Lin; H. -C. Zhang
2001
2001, vol.17, no.4
Combination of a vision system and a coordinate measuring machine for the reverse engineering of freeform surfaces
V. Carbone; M. Carocci; E. Savio; G. Sansoni; L. De Chiffre
2001
2001, vol.17, no.4
A new method of non-contact measurement for microtopography in semiconductor wafer implementing a new optical probe based on the precision defocus measurement
H. J. Pahk; W. J. Ahn
2001
2001, vol.17, no.4
In-process surface monitoring for laser cleaning processes using a chromatic modulation technique
J. M. Lee; W. M. Steen
2001
2001, vol.17, no.4
The house of quality for design rule priority
G. H. Lee; A. Kusiak
2001
2001, vol.17, no.4
Optimum gate design of freeform injection mould using the abductive network
J. C. Lin
2001
2001, vol.17, no.4
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