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期刊
ISSN
0913-5685
刊名
電子情報通信学会技術研究報告
参考译名
电子信息通信学会技术研究报告:硅器件和材料
收藏年代
2000~2024
全部
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2024
2001, vol.101, no.107
2001, vol.101, no.108
2001, vol.101, no.246
2001, vol.101, no.247
2001, vol.101, no.320
2001, vol.101, no.321
2001, vol.101, no.350
2001, vol.101, no.430
2001, vol.101, no.515
2001, vol.101, no.571
2001, vol.101, no.573
2001, vol.101, no.718
2001, vol.101, no.719
题名
作者
出版年
年卷期
New manufacturing technology concept in the 300mm era
Atsuyoshi Koike
2001
2001, vol.101, no.350
Influence of organic contamination on electrical property of gate oxides
Masao Inoue; Kanji Takahashi; Akinobu Teramoto; Yasuhiko Horie; Tatsunori Kaneoka; Yoshikazu Ohno; Eiji Hara; Junji Kobayashi
2001
2001, vol.101, no.350
Development of MIM/Ta{sub}2O{sub}5 capacitor process for 0.10μm-DRAM
Isamu Asano; Yoshitaka Nakamura; Masahiko Hiratani; Toshihide Nabatame; Shinpei Iijima; Tomonori Saeki; Takuya Futase; Satoshi Yamamoto; Tatsuyuki Saito; Toshihiro Sekiguchi
2001
2001, vol.101, no.350
Growth and doping mechanism in Si gas-source MBE in-situ doped with phosphorus
Maki Suemitsu; Yoshikazu Tsukidate
2001
2001, vol.101, no.350
Adsorption of organic contaminants on Si-wafer surface under vacuum
Teruyuki Hayashi; Kaname Suzuki; Misako Saito; Sigetoshi Sugawa; Tadahiro Ohmi
2001
2001, vol.101, no.350
Adhesion behavior of trace impurities remain in ultrapure water to silicon wafer surface
Masahiko Kogure; Takahiro Yonehara; Toshihisa Sakurai; Tadahiro Ohmi
2001
2001, vol.101, no.350
Theoretical study of silicon wafer pollution
Toshiyuki Yokosuka; Hideyuki Seta; Seiichi Takami; Momoji Kubo; Akira Miyamoto; Takeshi Takatsuka
2001
2001, vol.101, no.350
Photoresist developer reclamation technology from spent developer using an electrodialysis method
Hiroshi Sugawara; Yoshinori Tajima; Tadahiro Ohmi
2001
2001, vol.101, no.350
Photo resist stripping using oxidant controlled SOM
Hiroshi Tomita; Motoyuki Sato; Soichi Nadahara; Takayuki Saitoh; Tomonori Kojimaru; Yusuke Muraoka
2001
2001, vol.101, no.350
A study of the etchant for FPD glass substrate
Tatsuhiro Yabune; Toshihisa Sakurai; Tadahiro Ohmi; Keiichi Nii; Kanenori Itoh; Hirohisa Kikuyama
2001
2001, vol.101, no.350
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