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2001, vol.45, no.1	2001, vol.45, no.10	2001, vol.45, no.11	2001, vol.45, no.12	2001, vol.45, no.2	2001, vol.45, no.3
2001, vol.45, no.4	2001, vol.45, no.5	2001, vol.45, no.6	2001, vol.45, no.7	2001, vol.45, no.8	2001, vol.45, no.9

题名	作者	出版年	年卷期
Three-dimensional measuring equipment, aspherical lens, mold, roughness	Katsuhiro Miura	2001	2001, vol.45, no.12
Ultrahigh accurate 3-D profilometer using atomic force probe	Keiichi Yoshizumi	2001	2001, vol.45, no.12
Non-contact 3D imaging surface structure analyzer using interferometry	Hiroshi Matsushita	2001	2001, vol.45, no.12
Nanotopography metrology for silicon wafer	Masanori Yoshise	2001	2001, vol.45, no.12
Grinding simulation to develop processing machine for Φ300 Si wafer	Katsuo Sagawa; Hiroshi Eda; Libo Zhou; Jun Shimizu	2001	2001, vol.45, no.12
The characteristics on wear of masking photo resist for dry blasting - wear resistance of masking photo resist	Moriyasu Izawa; Masaki Sugimoto; Koichi Kitajima	2001	2001, vol.45, no.12
Study on cooling air grinding with SG wheel - 2nd report: effect of two cooling nozzles system on grinding accuracy	Katsutoshi Yamauchi; Hironori Karakasa; Mutsumi Touge; Junji Watanabe	2001	2001, vol.45, no.12
High speed gyration flow finishing of inner wall of tiny nozzle drilled by electric discharge machining (2nd report) - in the case of hardened stainless steel	Hiroshi Sugimori; Toshiji Kurobe	2001	2001, vol.45, no.12