中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0091-3286
刊名Optical Engineering
参考译名光学工程
收藏年代1998～2023



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1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2022 2023

2002, vol.41, no.1 2002, vol.41, no.10 2002, vol.41, no.11 2002, vol.41, no.12 2002, vol.41, no.2 2002, vol.41, no.3
2002, vol.41, no.4 2002, vol.41, no.5 2002, vol.41, no.6 2002, vol.41, no.7 2002, vol.41, no.8 2002, vol.41, no.9

题名作者出版年年卷期
Intensity compensation of a transmitted spectrum using an all-fiber Sagnac interferometerH. H. Cerecedo-Nunez; C. G. Trevino-Palacios; E. A. Kuzin20022002, vol.41, no.6
Quantitative analysis of the Shupe reduction in a fiber-optic Sagnac interferometerXuhan Dai; Xiaolin Zhao; Bingchu Cai; Guoguang Yang; Kejiang Zhou; Chen Liu20022002, vol.41, no.6
Analysis of astronomical data from optical superconducting tunnel junctionsJ. H. J. de Bruijne; A. P. Reynolds; M. A. C. Perryman; F. Favata; A. Peacock20022002, vol.41, no.6
Superconducting tunnel junctions as photon-counting imaging spectrometers from the optical to the X-ray bandPeter Verhoeve; Nicola Rando; Anthony Peacock; Didier Martin; Roland den Hartog20022002, vol.41, no.6
Ultraviolet-optical charge-coupled devices for space instrumentationMark Clampin20022002, vol.41, no.6
Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement accuracyAlbert Piterman; Zoran Ninkov20022002, vol.41, no.6
Lux transfer: complementary metal oxide semiconductors versus charge-coupled devicesJames Janesick20022002, vol.41, no.6
Empirical dark current modeling for complementary metal oxide semiconductor active pixel sensorIgor Shcherback; Alexander Belenky; Orly Yadid-Pecht20022002, vol.41, no.6
Fully automatic algorithm for region of interest location in camera calibrationXinyu Kou; Zhong Wang; Mingzhou Chen; Shenghua Ye20022002, vol.41, no.6
Inclusive bit error rate analysis for coherent optical code-division multiple-access systemGilad Katz; Dan Sadot20022002, vol.41, no.6
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