中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1065-514X
刊名VLSI Design
参考译名超大规模集成电路设计
收藏年代2008～2018



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018

2008, vol.2008, no.ICEC 2008, vol.2008, no.REGU 2008, vol.2008, no.SPIM

题名作者出版年年卷期
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform GeneratorV. Kerzerho; P. Cauvet; S. Bernard; F.Azais; M. Renovell; M. Comte; O. Chakib20082008, vol.2008, no.SPIM
Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral ApproachE. J. Peralias; M. A. Jalon; A. Rueda20082008, vol.2008, no.SPIM
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing TestYves Joannon; Vincent Beroulle; Chantal Robach; Smail Tedjini; Jean-Louis Carbonero20082008, vol.2008, no.SPIM
A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector ApproachJose A. Soares Augusto; Carlos Beltran Almeida20082008, vol.2008, no.SPIM
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter SystemsVishwanath Natarajan; Rajarajan Senguttuvan; Shreyas Sen; Abhjit Chatterjee20082008, vol.2008, no.SPIM
A Pull-in Based Test Mechanism for Device Diagnostic and Process CharacterizationL. A. Rocha; L. Mol; E. Cretu; R. F. Wolffenbuttel; J. Machado da Silva20082008, vol.2008, no.SPIM
Using Signal Envelope Detection for Online and Offline RF MEMS Switch TestingE. Simeu; H. N. Nguyen; P. Cauvet; S. Mir; L. Rufer; R. Khereddine20082008, vol.2008, no.SPIM
MEMS Switches and SiGe Logic for Multi-GHz Loopback TestingD. C. Keezer; D. Minier; P. Ducharme; D. Viens; G. Flynn; J. McKillop20082008, vol.2008, no.SPIM
A Dependable Microelectronic Peptide Synthesizer Using Electrode DataH. G. Kerkhoff; X. Zhang; F. Mailly; P. Nouet; H. Liu; A. Richardson20082008, vol.2008, no.SPIM



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