中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



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2022 2023 2024

2008, vol.10, no.1 2008, vol.10, no.2 2008, vol.10, no.3 2008, vol.10, no.4

题名作者出版年年卷期
Advanced Defect Characterization by STEM AnalysisSam Subramanian; Raghaw Rai; Khiem Ly; Tony Chrastecky; Randy Mulder; Keith Harber20082008, vol.10, no.2
Failure Analysis and the Scanning Optical MicroscopeR. Aaron Falk20082008, vol.10, no.2
Automated Backside Silicon Polishing for Die Encapsulated in a PackageBonnie Gannon20082008, vol.10, no.2
Trends and Roadmap for Outsourcing and Services In the FA IndustryMichel Villemain20082008, vol.10, no.2



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