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2009, vol.45, no.1 2009, vol.45, no.2 2009, vol.45, no.3 2009, vol.45, no.4 2009, vol.45, no.5 2009, vol.45, no.6

题名作者出版年年卷期
The Future of Microelectromechanical systems (MEMS)T. F. Marinis20092009, vol.45, no.3
Novel Approach of Semiconductor Manufacturing Process on Copper Dual Damascene Processes IntegrationC.-J. Weng20092009, vol.45, no.3
Nanomechanical Characterisation of Graded NiTi Films Fabricated Through Diffusion ModificationD. P. Cole; H. A. Bruck; A. L. Roytburd20092009, vol.45, no.3
Investigation of the Bulge Test Response of Molybdenum Thin Films at Room Temperature and at 100℃M. E. Walter; A. S. Schneider; T. Wubben; G. Richter; E. Arzt20092009, vol.45, no.3
Vibration Analysis at Microscale by Talbot Fringe Projection MethodR. Rodriguez-Vera; K. Genovese; J. A. Rayas; F. Mendoza-Santoyo20092009, vol.45, no.3
Analysis and Optomechanical Characterisation of a MEMS Micromirror DeviceC. Furlong20092009, vol.45, no.3
Damage Progression Using Speckle-Correlation and High-Speed Imaging for Survivability of Leadfree Packaging Under ShockP. Lall; D. Iyengar; S. Shantaram; D. Panchagade20092009, vol.45, no.3
The Failure Mechanisms of Micro-Scale Cantilevers Under Shock and Vibration StimuliM. Sheehy; J. Punch; S. Goyal; M. Reid; M. Lishchynska; G. Kelly20092009, vol.45, no.3
Experimental Determination of the Q-factors of Microcantilevers Coated With Thin Metal FilmsA. R. Klempner; R. T. Marinis; P. Hefti; R. J. Pryputniewicz20092009, vol.45, no.3
Preliminary Analyses of Tympanic-Membrane Motion from Holographic MeasurementsC. Furlong; J. J. Rosowski; N. Hulli; M. E. Ravicz20092009, vol.45, no.3



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