中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1561-8625
刊名Asian Journal of Control
参考译名亚洲控制杂志
收藏年代2000～2024



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2009, vol.11, no.1 2009, vol.11, no.2 2009, vol.11, no.3 2009, vol.11, no.4 2009, vol.11, no.5 2009, vol.11, no.6

题名作者出版年年卷期
INDUSTRIAL PERSPECTIVES OF AFM CONTROLChanmin Su20092009, vol.11, no.2
VIDEO-RATE SCANNING PROBE CONTROL CHALLENGES: SETTING THE STAGE FOR A MICROSCOPY REVOLUTIONM. J. Rost; G. J. C. van Baarle; A. J. Katan; W. M. van Spengen; P. Schakel; W. A. van Loo; T. H. Oosterkamp; J. W. M. Frenken20092009, vol.11, no.2
IDENTIFICATION, CONTROL AND HYSTERESIS COMPENSATION OF A 3 DOF METROLOGICAL AFMRoel Merry; Mustafa Uyanik; Rene van de Molengraft; Richard Koops; Marijn van Veghel; Maarten Steinbuch20092009, vol.11, no.2
HIGH-SPEED SERIAL-KINEMATIC SPM SCANNER: DESIGN AND DRIVE CONSIDERATIONSKam K. Leang; Andrew J. Fleming20092009, vol.11, no.2
RAPID AFM IMAGING OF LARGE SOFT SAMPLES IN LIQUID WITH SMALL FORCESSzuchi Tien; Santosh Devasia20092009, vol.11, no.2
IMAGE-BASED HYSTERESIS MODELING AND COMPENSATION FOR AN AFM PIEZO-SCANNERYudong Zhang; Yongchun Fang; Xianwei Zhou; Xiaokun Dong20092009, vol.11, no.2
A COMPARISON OF CONTROL ARCHITECTURES FOR ATOMIC FORCE MICROSCOPESJ. A. Butterworth; L. Y. Pao; D. Y. Abramovitch20092009, vol.11, no.2
CREEP AND HYSTERESIS COMPENSATION FOR NANOMANIPULATION USING ATOMIC FORCE MICROSCOPEQinmin Yang; S. Jagannathan20092009, vol.11, no.2
SEMI-AUTOMATIC TUNING OF PID GAINS FOR ATOMIC FORCE MICROSCOPESDaniel Y. Abramovitch; Storrs Hoen; Richard Workman20092009, vol.11, no.2
FORCE/MOTION SLIDING MODE CONTROL OF THREE TYPICAL MECHANISMSRong-Fong Fung; Chin-Fu Chang20092009, vol.11, no.2
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