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2016, vol.52, no.1 2016, vol.52, no.2 2016, vol.52, no.3 2016, vol.52, no.4 2016, vol.52, no.5 2016, vol.52, no.6

题名作者出版年年卷期
Editorial-Photomechanics Special IssueHuntley, J. M.; Groves, R. M.; Bhattacharya, N.20162016, vol.52, no.4
A new Method for Processing Time Averaged Vibration Patterns: Linear RegressionSomers, P. A. A. M.; Bhattacharya, N.20162016, vol.52, no.4
Damage Investigation in Composite Materials by Means of New Thermal Data Processing ProceduresPalumbo, D.; Galietti, U.20162016, vol.52, no.4
Fast and Dense 2D and 3D Displacement Field Estimation by a Highly Parallel Image Correlation AlgorithmLe Besnerais, G.; Le Sant, Y.; Leveque, D.20162016, vol.52, no.4
Optimization of a Cruciform Specimen Geometry for the Identification of Constitutive Parameters Based Upon Full-Field MeasurementsBertin, M. B. R.; Hild, F.; Roux, S.20162016, vol.52, no.4
Damage Investigation in A319 Aluminium Alloy by X-ray Tomography and Digital Volume Correlation during In Situ High-Temperature Fatigue TestsDahdah, N.; Limodin, N.; El Bartali, A.; Seghir, R.; Charkaluk, E.; Buffiere, J. Y.; Witz, J. F.20162016, vol.52, no.4
Adaptive Isogeometric Digital Height Correlation: Application to Stretchable ElectronicsHoefnagels, J. P. M.; Kleinendorst, S. M.; Fleerakkers, R. C.; van Maris, M. P. F. H. L.; Cattarinuzzi, E.; Verhoosel, C. V.; Geers, M. G. D.20162016, vol.52, no.4
Applied Photoelasticity for Residual Stress Measurement inside Crystal Silicon Wafers for Solar ApplicationsJagailloux, F.; Valle, V.; Dupre, J. -C.; Penot, J. -D.; Chabli, A.20162016, vol.52, no.4



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