中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0895-7959
刊名High Pressure Research
参考译名高压研究
收藏年代2002～2024



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2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024

2016, vol.36, no.1 2016, vol.36, no.2 2016, vol.36, no.3 2016, vol.36, no.4

题名作者出版年年卷期
The phase transformation in zirconium followed with ms-scale time-resolved X-ray absorption spectroscopyDewaele, A.; Andre, R.; Occelli, F.; Mathon, O.; Pascarelli, S.; Irifune, T.; Loubeyre, P.20162016, vol.36, no.3
EXAFS studies under high pressure by X-ray Raman scatteringHiraoka, N.; Fukui, H.; Okuchi, T.20162016, vol.36, no.3
Pressure dependence of the electronic structure of 4f and 3d electron systems studied by X-ray emission spectroscopyYamaoka, Hitoshi20162016, vol.36, no.3
Spectroscopy of low and intermediate Z elements at extreme conditions: in situ studies of Earth materials at pressure and temperature via X-ray Raman scatteringSternemann, C.; Wilke, M.20162016, vol.36, no.3
Probing the local, electronic and magnetic structure of matter under extreme conditions of temperature and pressureTorchio, R.; Boccato, S.; Cerantola, V.; Morard, G.; Irifune, T.; Kantor, I.20162016, vol.36, no.3
Laser shock XAFS studies at OMEGA facilityPing, Yuan; Coppari, Federica20162016, vol.36, no.3
High pressure X-ray emission spectroscopy at the advanced photon sourceXiao, Yuming; Chow, Paul; Shen, Guoyin20162016, vol.36, no.3
Frontiers of high pressure X-ray absorption spectroscopyPascarelli, Sakura; Haskel, Daniel; Ishimatsu, Naoki20162016, vol.36, no.3
In situ characterization of liquid network structures at high pressure and temperature using X-ray absorption spectroscopy coupled with the Paris-Edinburgh pressRosa, A. D.; Pohlenz, J.; de Grouchy, C.; Cochain, B.; Kono, Y.; Pasternak, S.; Mathon, O.; Irifune, T.; Wilke, M.20162016, vol.36, no.3
Combined single crystal polarized XAFS and XRD at high pressure: probing the interplay between lattice distortions and electronic order at multiple length scales in high T-c cupratesFabbris, G.; Hucker, M.; Gu, G. D.; Tranquada, J. M.; Haskel, D.20162016, vol.36, no.3
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