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期刊
ISSN
1537-0755
刊名
Electronic Device Failure Analysis
参考译名
电子设备故障分析
收藏年代
2004~2024
全部
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2019, vol.21, no.1
2019, vol.21, no.2
2019, vol.21, no.3
2019, vol.21, no.4
题名
作者
出版年
年卷期
THE EVOLUTION OF METROLOGY: FROM LAB TO FAB
Nicholas Antoniou
2019
2019, vol.21, no.2
TIVA MEASUREMENTS WITH VISIBLE AND 1064-nm LASERS
Paiboon Tangyunyong; Andrea Rodarte
2019
2019, vol.21, no.2
MEASURING TEMPERATURE IN GaN HEMTs: AN APPROACH BASED ON RAMAN SPECTROSCOPY
Bertrand Boudart; Yannick Guhel
2019
2019, vol.21, no.2
DATA-DRIVEN RELIABILITY FOR DATACENTER HARD DISK DRIVES
Alan Yang; AmirEmad Ghassami; Elyse Rosenbaum; Negar Kiyavash
2019
2019, vol.21, no.2
FAILURE RISK ASSESSMENT OF LASER DIODE STACKS FOR A MARTIAN APPLICATION
Guillaume Thin; Frederic Bourcier; Herve Moisan
2019
2019, vol.21, no.2
THE POWER OF IC REVERSE ENGINEERING FOR HARDWARE TRUST AND ASSURANCE
Fatemeh Ganji; Domenic Forte; Navid Asadizanjani; Mark Tehranipoor; Damon Woodard
2019
2019, vol.21, no.2
NEW SCRIBING STATION ENABLES CLEAN AND FAST SUBSTRATE DOWNSIZING
Ted Kolasa
2019
2019, vol.21, no.2
NEW IMAGING TECHNOLOGY FEATURES HIGH SENSITIVITY FOR FAST ANALYSIS OF FOREIGN MATERIALS
Felix Beaudoin
2019
2019, vol.21, no.2
CONDUCTIVE UNDERFILL EPOXY
Felix Beaudoin
2019
2019, vol.21, no.2
NEW SOLDER PASTE SUITS MULTIPLE COMPONENT SIZES AND TYPES
Felix Beaudoin
2019
2019, vol.21, no.2
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