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期刊
ISSN
1537-0755
刊名
Electronic Device Failure Analysis
参考译名
电子设备故障分析
收藏年代
2004~2024
全部
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2020, vol.22, no.1
2020, vol.22, no.2
2020, vol.22, no.3
题名
作者
出版年
年卷期
ELECTRONIC DEVICE FA IN THE TIME OF COVID-19 AND SOCIAL UNREST
Nicholas Antoniou
2020
2020, vol.22, no.3
PRODUCT NEWS
Ted Kolasa
2020
2020, vol.22, no.3
ISTFA 2020 PREVIEW
David Grosjean
2020
2020, vol.22, no.3
IMPROVED SIGNAL DETECTION SENSITIVITY FOR HIGH RESOLUTION IMAGING IN SCANNING ACOUSTIC TOMOGRAPHY
Hiroki Mitsuta; Taiichi Takezaki; Kaoru Sakai; Kenta Sumikawa; Masakatsu Murai; Kotaro Kikukawa
2020
2020, vol.22, no.3
DEFECT CHARACTERIZATION OF ADVANCED PACKAGES USING NOVEL PHASE AND DARK FIELD X-RAY IMAGING
S. H. Lau; Sheraz Gul; Guibin Zan; David Vine; Sylvia Lewis; Wenbing Yun
2020
2020, vol.22, no.3
FAILURE ANALYSIS, STATISTICAL RISK ASSESSMENT, AND ADVANCED MODELING IN A STRUCTURED PROBLEM SOLVING APPROACH: CASE STUDY FOR A DELAMINATION DEFECT IN THE AUTOMOTIVE SEMICONDUCTOR INDUSTRY
Corinne Berges
2020
2020, vol.22, no.3
SRAM PHYSICAL FAILURE ANALYSIS CHALLENGES IN TECHNOLOGY NODES BEYOND 14 nm
Noor Jehan Saujauddin; Kevin Davidson; Esther P. Y. Chen
2020
2020, vol.22, no.3
SENSORIZATION: HOW MEMS TECHNOLOGY IS ENABLING OUR DIGITAL WORLD
Timothy Brosnihan
2020
2020, vol.22, no.3
I HAD A DREAM
David Burgess
2020
2020, vol.22, no.2
SUSTAINABLE 3D PRINTED SUPER MAGNETS
Nicholas Antoniou
2020
2020, vol.22, no.2
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