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期刊
ISSN
1537-0755
刊名
Electronic Device Failure Analysis
参考译名
电子设备故障分析
收藏年代
2004~2024
全部
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2024
2020, vol.22, no.1
2020, vol.22, no.2
2020, vol.22, no.3
题名
作者
出版年
年卷期
ARTIFICIAL INTELLIGENCE PROVIDES OPPORTUNITY FOR FAILURE ANALYSIS
William Hammond; Deepak Goyal
2020
2020, vol.22, no.2
INNOVATIVE PUCK DESIGN FOR THE MECHANICAL CROSS-SECTIONING AND SUBSEQUENT ANALYSIS OF SEMICONDUCTOR PACKAGED SAMPLES IN FAILURE ANALYSIS
Fauzia Khatkhatay; Pradip Sairam Pichumani
2020
2020, vol.22, no.2
A BIOLOGICALLY INSPIRED APPROACH TO INTERCEPTION
Frances S. Chance
2020
2020, vol.22, no.2
COMBINED SCM AND NANOPROBING STUDY OF RESISTIVE FAILS ON SOI FINFET DEVICES
Lucile C. Teague Sheridan; Don Nedeau
2020
2020, vol.22, no.2
3D HOT-SPOT LOCALIZATION BY LOCK-IN THERMOGRAPHY
Sebastian Brand; Frank Altmann
2020
2020, vol.22, no.2
ESREF 2019 IN TOULOUSE
Nicolas Nolhier; Guillaume Bascoul
2020
2020, vol.22, no.2
ROAD READY COMPACT PORTABLE TEST SYSTEM
Ted Kolasa
2020
2020, vol.22, no.2
MULTI-LAYER CERAMIC CAPACITOR
Nicholas Antoniou
2020
2020, vol.22, no.2
VACUUM-RELEASE STORAGE AND SHIPPING BOXES
Nicholas Antoniou
2020
2020, vol.22, no.2
SUSTAINABLE 3D PRINTED SUPER MAGNETS
Nicholas Antoniou
2020
2020, vol.22, no.2
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