中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0956-5515
刊名Journal of Intelligent Manufacturing
参考译名智能化制造业杂志
收藏年代1999～2024



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1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013 2014 2015 2016
2017 2018 2019 2020 2021 2022
2023 2024

2024, vol.35, no.1 2024, vol.35, no.2 2024, vol.35, no.3 2024, vol.35, no.4 2024, vol.35, no.5 2024, vol.35, no.6

题名作者出版年年卷期
A real spatial-temporal attention denoising network for nugget quality detection in resistance spot weldZhou, Jie; Xi, Zerui; Wang, Shilong; Yang, Bo; Zhang, Youhong; Zhang, Yucheng20242024, vol.35, no.6
A deep convolutional network combining layerwise images and defect parameter vectors for laser powder bed fusion process anomalies classificationDeng, Yifan; Zhang, Yingjie; Yuan, Zhenghui; Jiang, Zimeng; Zhang, Aoming; Chen, Zhangdong; Ma, Chenguang20242024, vol.35, no.6
Digital Twin-based manufacturing system: a survey based on a novel reference modelLiu, Shimin; Zheng, Pai; Bao, Jinsong20242024, vol.35, no.6
In-situ porosity prediction in metal powder bed fusion additive manufacturing using spectral emissions: a prior-guided machine learning approachAtwya, Mohamed; Panoutsos, George20242024, vol.35, no.6
Competing refurbishment in a supply chain with different selling modesZhang, Yan; Zhang, Wen; Shi, Xiao; Hou, Ting20242024, vol.35, no.6
An innovative integrated approach to automatic defect detection system of cell phone case manufacturing in an empirical implementationLiao, Chao-Chang; Hsu, Chih-Ching; Young, Hong-Tsu; Li, Kuan-Ming20242024, vol.35, no.6
Digitalization platform for data-driven quality management in multi-stage manufacturing systemsFilz, Marc-Andre; Bosse, Jan Philipp; Herrmann, Christoph20242024, vol.35, no.6
Digital twin enhanced fault diagnosis reasoning for autoclaveWang, Yucheng; Tao, Fei; Zuo, Ying; Zhang, Meng; Qi, Qinglin20242024, vol.35, no.6
Tool wear prediction in milling CFRP with different fiber orientations based on multi-channel 1DCNN-LSTMLi, Bohao; Lu, Zhenghui; Jin, Xiaoliang; Zhao, Liping20242024, vol.35, no.6
Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural networkYe, Shujiao; Wang, Zheng; Xiong, Pengbo; Xu, Xinhao; Du, Lintong; Tan, Jiubin; Wang, Weibo20242024, vol.35, no.6
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