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期刊
ISSN
0913-5685
刊名
電子情報通信学会技術研究報告
参考译名
电子信息通信学会技术研究报告:电子装置
收藏年代
2000~2024
关联期刊
参考译名
收藏年代
電子情報通信学会技術研究報告
电子信息通信学会技术研究报告:电子装置
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2000
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2001, vol.101, no.104
2001, vol.101, no.14
2001, vol.101, no.15
2001, vol.101, no.160
2001, vol.101, no.161
2001, vol.101, no.162
2001, vol.101, no.294
2001, vol.101, no.295
2001, vol.101, no.313
2001, vol.101, no.337
2001, vol.101, no.500
2001, vol.101, no.501
2001, vol.101, no.549
2001, vol.101, no.550
2001, vol.101, no.551
2001, vol.101, no.617
2001, vol.101, no.618
2001, vol.101, no.619
2001, vol.101, no.721
2001, vol.101, no.78
2001, vol.101, no.79
2001, vol.101. no.415
2001, vol.101. no.416
题名
作者
出版年
年卷期
Realization of thermally stable ohmic contact using Cu-Hf amorphous alloy film to n-type InP
Mayumi B. Takeyama; Nobuhisa Sakaguchi; Atsushi Noya; Tamotsu Hashizume; Hideki Hasegawa
2001
2001, vol.101, no.104
Application of ZrN barrier with nanocrystalline structure for high performance Cu metallization
Mayumi B. Takeyama; Takaomi Itoi; Eiji Aoyagi; Atsushi Noya
2001
2001, vol.101, no.104
Isothermal capacitance transient spectroscopy study for p-GaN Schottky contacts
Kenji Shiojima; Suehiro Sugitani; Shiro Sakai
2001
2001, vol.101, no.104
Estimation of conduction-band offset in GaAsP/GaAs heterostructure by triple-barrier resonant tunneling diodes
Susumu Ohki; Hiroki Funato; Michihiko Suhara; Tugunori Okumura; Lars-Erik Wernersson; Werner Seifert
2001
2001, vol.101, no.104
Surface control of AlGaN/GaN heterostructures using an ultrathin AlO{sub}x film and an ECR-CVD SiN{sub}x film
Shinya Ootomo; Tamotsu Hashizume; Hideki Hasegawa
2001
2001, vol.101, no.104
Contactless electrical characterization of SOI layers: SPV measurements with UV excitation
A. En; K. Eguchi; S. Nakamura; M. Suhara; T. Okumura
2001
2001, vol.101, no.104
Study of (100)InP surface using molecular orbital calculation method
Yoichi Yamamura; Yuki Kasai; Satoshi Miyamura; Takao Inokuma; Koichi Iiyama; Saburo Takamiya
2001
2001, vol.101, no.104
Sb and Bi passivation effect on GaAs
Nobuhiro Kuroda; Hideaki Ikoma
2001
2001, vol.101, no.104
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