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期刊

ISSN	1063-7397
刊名	Russian Microelectronics
参考译名	俄罗斯微电子学
收藏年代	2002～2023

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2020	2021	2022	2023

2002, vol.31, no.1

2002, vol.31, no.2

2002, vol.31, no.3

2002, vol.31, no.4

2002, vol.31, no.5

2002, vol.31, no.6

题名

作者

出版年

年卷期

Two-dimensional epitaxial nucleation with large critical-nucleus size

I. G. Neizvestny; N. L. Shvarts; Z. Sh. Yanovitskaya

2002

2002, vol.31, no.2

Thermal oxidation of InP promoted by the formation of N{sub}2O

I. Ya. Mittova; S. S. Lavrushina; E. V. Popova; A. A. Muratov; V. M. Kashkarov

2002

2002, vol.31, no.2

Solid-phase reactions in the thermal oxidation of Ni/GaAs heterostructures

I. Ya. Mittova; E. V. Tomina; A. S. Sukhochev; A. N. Prokin; A. O. Vasyukevich

2002

2002, vol.31, no.2

Porous-silicon formation in HF-HNO{sub}3-H{sub}2O etchants

E. A. Starostina; V. V. Starkov; A. F. Vyatkin

2002

2002, vol.31, no.2

Evolution of dopant concentration from a Gaussian profile in a nonuniform temperature field

V. I. Rudakov; V. V. Ovcharov

2002

2002, vol.31, no.2

Wet etching of ion-implanted silicon dioxide monitored by atomic-force microscopy

A. A. Bukharaev; N. I. Nurgazizov; A. V. Sugonyako

2002

2002, vol.31, no.2

Ellipsometric characterization of the transition layer in SiC/AlN structures

V. V. Luchinin; M. F. Panov

2002

2002, vol.31, no.2

Model and logic gates for quantum computing with a two-level system in a resonant-frequency field

A. L. Danilyuk; V. E. Borisenko

2002

2002, vol.31, no.2

Double-junction Schottky diodes using a Ti/Si/Al structure

D. A. Andreev; N. S. Grushko

2002

2002, vol.31, no.2

Local ellipsometric inspection of small windows

E. S. Lonskii

2002

2002, vol.31, no.2