中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2002, vol.23, no.1 2002, vol.23, no.10 2002, vol.23, no.11 2002, vol.23, no.12 2002, vol.23, no.2 2002, vol.23, no.3
2002, vol.23, no.4 2002, vol.23, no.5 2002, vol.23, no.6 2002, vol.23, no.7 2002, vol.23, no.8 2002, vol.23, no.9

题名作者出版年年卷期
Temperature dependence of hot-carrier degradation in silicon-on-insulator dynamic threshold voltage MOS transistorsJae-Ki Lee; Nag-Jong Choi; Chong-Gun Yu; Jean-Pierre Colinge; Jong-Tae Park20022002, vol.23, no.11
50-nm gate Schottky source/drain p-MOSFETs with a SiGe channelKeiji Ikeda; Yoshimi Yamashita; Akira Endoh; Tetsu Fukano; Kohki Hikosaka; Takashi Mimura20022002, vol.23, no.11
Impact of the trapping of anode hot holes on silicon dioxide breakdownEric M. Vogel; Da-Wei Heh; Joseph B. Bernstein; John S. Suehle20022002, vol.23, no.11
Multilevel vertical-channel SONOS nonvolatile memory on SOIYong Kyu Lee; Jae Sung Sim; Suk Kang Sung; Chang Ju Lee; Tae Hun Kim; Jong Duk Lee; Byung Gook Park; Dong Hun Lee; Young Wug Kim20022002, vol.23, no.11
Voltage dependence of hard breakdown growth and the reliability implication in thin dielectricsBarry P. Linder; Salvatore Lombardo; James H. Stathis; Alex Vayshenker; David J. Frank20022002, vol.23, no.11
Extraction of Si-SiO{sub}2 interface trap densities in MOS structures with ultrathin oxidesDaniel Bauza20022002, vol.23, no.11
Ballistic MOSFET reproduces current-voltage characteristics of an experimental deviceKenji Natori20022002, vol.23, no.11
Novel self-convergent programming method using source-induced band-to-band hot electron injectionLiyang Pan; Jun Zhu; Zhihong Liu; Ying Zeng; Jianzhao Liu20022002, vol.23, no.11
Effect of Al inclusion in HfO[sub}2 on the physical and electrical properties of the dielectricsW. J. Zhu; T. Tamagawa; M. Gibson; T. Furukawa; T. P. Ma20022002, vol.23, no.11
Boron retarded diffusion in the presence of indium or germaniumHong-Jyh Li; Taras A. Kirichenko; Puneet Kohli; Sanjay K. Banerjee; Eric Graetz; Robin Tichy; Peter Zeitzoff20022002, vol.23, no.11
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