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期刊

ISSN	0741-3106
刊名	IEEE Electron Device Letters
参考译名	IEEE电子器件快报
收藏年代	1998～2007

全部

1998	1999	2000	2001	2002	2003
2004	2005	2006	2007

题名

作者

出版年

年卷期

A 0.26-μm{sup}2 U-Shaped Nitride-Based Programming Cell on Pure 90-nm CMOS Technology

Han-Chao Lai; Kai-Yuan Cheng; Ya-Chin King; Chrong-Jung Lin

2007

2007, vol.28, no.9

Substrate Bias Effect Linked to Parasitic Series Resistance in Multiple-Gate SOI MOSFETs

Tamara Rudenko; Valeria Kilchytska; Nadine Collaert; Malgorzata Jurczak; Alexey Nazarov; Denis Flandre

2007

2007, vol.28, no.9

CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSI

Chien-Ting Lin; Manfred Ramin; Michael Pas; Rick Wise; Yean-Kuen Fang; Che-Hua Hsu; Yao-Tsung Huang; Li-Wei Cheng; Mike Ma

2007

2007, vol.28, no.9

Profiling of Nitride-Trap-Energy Distribution in SONOS Flash Memory by Using a Variable-Amplitude Low-Frequency Charge-Pumping Technique

Yi-Ying Liao; Sheng-Fu Horng; Yao-Wen Chang; Tao-Cheng Lu; Kuang-Chao Chen; Tahui Wang; Chin-Yuan Lu

2007

2007, vol.28, no.9

High Mobility Strained Ge pMOSFETs With High-κ/Metal Gate

Gareth Nicholas; T. J. Grasby; D. J. F. Fulgoni; C. S. Beer; J. Parsons; M. Meuris; M. M. Heyns

2007

2007, vol.28, no.9

Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETs

J. L. P. J. van der Steen; R. J. E. Hueting; G. D. J. Smit; T. Hoang; J. Holleman; J. Schmitz

2007

2007, vol.28, no.9

Measurement of Channel Stress Using Gate Direct Tunneling Current in Uniaxially Stressed nMOSFETs

Chen-Yu Hsieh; Ming-Jer Chen

2007

2007, vol.28, no.9

PMOSFET Reliability Study for Direct Silicon Bond (DSB) Hybrid Orientation Technology (HOT)

Yao-Tsung Huang; Angelo Pinto; Chien-Ting Lin; Che-Hua Hsu; Manfred Ramin; Mike Seacrist; Mike Ries; Kenneth Matthews; Billy Nguyen; Melissa Freeman; Bruce Wilks; Chuck Stager; Charlene Johnson; Laurie Denning; Joe Bennett; Sachin Joshi

2007

2007, vol.28, no.9

Gate Voltage Dependence of MOSFET 1/f Noise Statistics

Mete Erturk; Tian Xia; William F. Clark

2007

2007, vol.28, no.9

A Novel Nanowire Channel Poly-Si TFT Functioning as Transistor and Nonvolatile SONOS Memory

Shih-Ching Chen; Ting-Chang Chang; Po-Tsun Liu; Yung-Chun Wu; Po-Shun Lin; Bae-Heng Tseng; Jang-Hung Shy; S. M. Sze; Chun-Yen Chang; Chen-Hsin Lien

2007

2007, vol.28, no.9

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