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中国机械工程学会生产工程分会知识服务平台

期刊

ISSN	0741-3106
刊名	IEEE Electron Device Letters
参考译名	IEEE电子器件快报
收藏年代	1998～2007

全部

1998	1999	2000	2001	2002	2003
2004	2005	2006	2007

2003, vol.24, no.1	2003, vol.24, no.10	2003, vol.24, no.11	2003, vol.24, no.12	2003, vol.24, no.2	2003, vol.24, no.3
2003, vol.24, no.4	2003, vol.24, no.5	2003, vol.24, no.6	2003, vol.24, no.7	2003, vol.24, no.8	2003, vol.24, no.9

题名	作者	出版年	年卷期
Potential Vulnerability of Dynamic CMOS Logic to Soft Gate Oxide Breakdown	B. Kaczer; G. Groeseneken	2003	2003, vol.24, no.12
Fully Silicided NiSi and Germanided NiGe Dual Gates on SiO{sub}2 n- and p-MOSFETs	D. S. Yu; C. H. Wu; C. H. Huang; Albert Chin; W. J. Chen; Chunxiang Zhu; M. F. Li; Dim-Lee Kwong	2003	2003, vol.24, no.12
Data Retention Characteristics of Sub-100 nm NAND Flash Memory Cells	Jae-Duk Lee; Jeong-Hyuk Choi; Donggun Park; Kinam Kim	2003	2003, vol.24, no.12
Explaining the Parameters of the Electron Valence-Band Tunneling Related Lorentzian Noise in Fully Depleted SOI MOSFETs	E. Simoen; A. Mercha; J. M. Rafi; C. Claeys; N. B. Lukyanchikova; N. Garbar	2003	2003, vol.24, no.12
Effects of Gate Notching Profile Defect on Performance Characteristics of Short-Channel NMOSFET With Channel Length of 0.12μm	Sang-Hun Seo; Won-Suk Yang; Sung-Jin Kim; Jun-Yong Ju; Joo- Young Kim; Hyun-Chul Peak; Seung-Hyun Park; Seug-Gyu Kim; Kyeong-Tae Kim	2003	2003, vol.24, no.12
Substrate Current Based Avalanche Multiplication Measurement in 120 GHz SiGe HBTs	Jun Pan; Guofu Niu; Jin Tang; Yun Shi; Alvin J. Joseph; David L. Harame	2003	2003, vol.24, no.12
Suppression of Corner Effects in Triple-Gate MOSFETs	J. G. Possum; J.-W. Yang; V. P. Trivedi	2003	2003, vol.24, no.12
High-Performance MIM Capacitor Using ALD High-κ HfO{sub}2-Al{sub}2O{sub}3 Laminate Dielectrics	Shi-Jin Ding; Hang Hu; H. F. Lim; S. J. Kim; X. F. Yu; Chunxiang Zhu; M. F. Li; Byung Jin Cho; Daniel S. H. Chan; Subhash C. Rustagi; M. B. Yu; Albert Chin; Dim-Lee Kwong	2003	2003, vol.24, no.12
Surface Treatment Effect on the Poly-Si TFTs Fabricated by Electric Field Enhanced Crystallization of Ni/a-Si:H Films	Binn Kim; Hae-Yeol Kim; Hyun-Sik Seo; Sung Ki Kim; Chang-Dong Kim	2003	2003, vol.24, no.12
60-GHz High Power Performance In{sub}0.35Al{sub}0.65As-In{sub}0.35Ga{sub}0.65As Metamorphic HEMTs on GaAs	M. Zaknoune; M. Ardouin; Y. Cordier; S. Bollaert; B. Bonte; D. Theron	2003	2003, vol.24, no.12

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