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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：电子装置
收藏年代2000～2024

关联期刊参考译名收藏年代
電子情報通信学会技術研究報告电子信息通信学会技术研究报告：电子装置 


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2018 2019 2020 2021 2022 2023
2024

2003, vol.103, no.117 2003, vol.103, no.159 2003, vol.103, no.160 2003, vol.103, no.161 2003, vol.103, no.437 2003, vol.103, no.46
2003, vol.103, no.497 2003, vol.103, no.558

题名作者出版年年卷期
Front-end process technology for sub-50nm CMOS and beyondYoshitaka Tsunashima20032003, vol.103, no.159
Junction leakage characteristics of shallow trench isolation (STI) with nitrogen pile-up sidewall oxideMyeong Won Lee; In Man Kang; Byung Yong Choi; Dong-Soo Woo; Woo Young Choi; Jong Duk Lee; Byung-Gook Park20032003, vol.103, no.159
Shallow junction formed by UV pulsed laser annealing for Si micro-electronicsTakashi Noguchi20032003, vol.103, no.159
Fabrication of low loss transmission line with surface micromachining technologyHan-Shin Lee; Sung-Chan Kim; Byoung-Ok Lim; Kyoung-Man Kim; Won-Young Uhm; Young-Hoon Chun; Dong-Hoon Shin; Soon-Koo Kim; Hyun-Chang Park; Jin-Koo Rhee20032003, vol.103, no.159
Structural analyses of Cu[111] layer on Nb[110] barrier formed on SiO{sub}2Md. Maniruzzaman; Mayumi B. Takeyama; Yuichiro Hayasaka; Eiji Aoyagi; Tetu Ohsuna; Atsushi Noya20032003, vol.103, no.159
High performance poly-silicon TFT by excimer laser annealingMin Koo Han20032003, vol.103, no.159
Effects of self-aligned field induced drain with double spacer on the characteristics of poly-Si TFTJeong-Ah Ahn; Ohyun Kim20032003, vol.103, no.159
Properties of LiNbO{sub}3 thin films fabricated CSD (chemical solution decomposition) methodYong-Seong Kim; Soon-Won Jung; Sang-Hyun Jeong; Yong-Il In; Kwang-Ho Kim; Kwangsoo No20032003, vol.103, no.159
Local characterization of electronic transport in microcrystalline germanium thin films by atomic force microscopy using a conducting probeK. Makihara; Y. Okamoto; H. Nakagawa; M. Ikeda; H. Murakami; S. Miyazaki20032003, vol.103, no.159
Double-gate MOSFETs for nano CMOS technology - body-tied double-gate MOSFETsJong-Ho Lee; Tai-Su Park; Euijoon Yoon20032003, vol.103, no.159
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