中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2004, vol.25, no.1 2004, vol.25, no.10 2004, vol.25, no.11 2004, vol.25, no.12 2004, vol.25, no.2 2004, vol.25, no.3
2004, vol.25, no.4 2004, vol.25, no.5 2004, vol.25, no.6 2004, vol.25, no.7 2004, vol.25, no.8 2004, vol.25, no.9

题名作者出版年年卷期
Integration of Ba{sub}xSr{sub}(1-x)TiO{sub}3 Thin Films With AlGaN/GaN HEMT CircuitsHongtao Xu; Nadia K. Pervez; Peter J. Hansen; Likun Shen; Stacia Keller; Umesh K. Mishra; Robert A. York20042004, vol.25, no.2
Low Damage, Cl{sub}2-Based Gate Recess Etching for 0.3-μm Gate-Length AlGaN/GaN HEMT FabricationWen-Kai Wang; Yu-Jen Li; Cheng-Kuo Lin; Yi-Jen Chan; Guan-Ting Chen; Jen-Inn Chyi20042004, vol.25, no.2
Power and Linearity Characteristics of GaN MISFETs on Sapphire SubstrateA. Chini; J. Wittich; S. Heikman; S. Keller; S. P. DenBaars; U. K. Mishra20042004, vol.25, no.2
High Linearity InGaP/GaAs Power HBTs by Collector DesignChe-ming Wang; Hung-Tsao Hsu; Hsiu Chuan Shu; Yue-ming Hsin20042004, vol.25, no.2
Temperature Dependence of Performance of InGaN/GaN MQW LEDs With Different Indium CompositionsChul Huh; William J. Schaff; Lester F. Eastman; Seong-Ju Park20042004, vol.25, no.2
Physical Identification of Gate Metal Interdiffusion in GaAs PHEMTsY. C. Chou; R. Grundbacher; D. Leung; R. Lai; P. H. Liu; Q. Kan; M. Biedenbender; M. Wojtowicz; D. Eng; A. Oki20042004, vol.25, no.2
Extraction of Material Parameters in Film Bulk Acoustic Resonator (FBAR) Using Genetic AlgorithmJeongheum Lee; Jaeyong Jung; Jong-Il Park; Hyeongdong Kim20042004, vol.25, no.2
Robust High-Quality HfN-HfO{sub}2 Gate Stack for Advanced MOS Device ApplicationsH. Y. Yu; J. F. Kang; C. Ren; J. D. Chen; Y. T. Hou; C. Shen; M. F. Li; D. S. H. Chan; K. L. Bera; C. H. Tung; D. -L. Kwong20042004, vol.25, no.2
Vertical RESURF Diodes Manufactured by Deep-Trench Etch and Vapor-Phase DopingC. Rochefort; R. van Dalen20042004, vol.25, no.2
Experimental Analysis of the Effect of Metal Thickness on the Quality Factor in Integrated Spiral Inductors for RF ICsYun-Seok Choi; Jun-Bo Yoon20042004, vol.25, no.2
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