中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2004, vol.25, no.1 2004, vol.25, no.10 2004, vol.25, no.11 2004, vol.25, no.12 2004, vol.25, no.2 2004, vol.25, no.3
2004, vol.25, no.4 2004, vol.25, no.5 2004, vol.25, no.6 2004, vol.25, no.7 2004, vol.25, no.8 2004, vol.25, no.9

题名作者出版年年卷期
Lateral RESURF MOSFET Fabricated on 4H-SiC(0001) C-FaceMitsuo Okamoto; Seiji Suzuki; Makoto Kato; Tsutomu Yatsuo; Kenji Fukuda20042004, vol.25, no.6
High-κ/Metal-Gate Stack and Its MOSFET CharacteristicsRobert Chau; Suman Datta; Mark Doczy; Brian Doyle; Jack Kavalieros; Matthew Metz20042004, vol.25, no.6
Strained-Si-Strained-SiGe Dual-Channel Layer Structure as CMOS Substrate for Single Workfunction Metal-Gate TechnologyShaofeng Yu; Jongwan Jung; Judy L. Hoyt; Dimitri A. Antoniadis20042004, vol.25, no.6
A Novel Four-Mask-Processed Poly-Si TFT Fabricated Using Excimer Laser Crystallization of an Edge-Thickened α-Si Active IslandTien-Fu Chen; Ching-Fa Yeh; Chun-Yen Liu; Jen-Chung Lou20042004, vol.25, no.6
A Polymer Transistor Circuit Using PDHTTJurgen Krumm; Elke Eckert; Wolfram H. Glauert; Andreas Ullmann; Walter Fix; Wolfgang Clemens20042004, vol.25, no.6
Voltage-Splitting Technique for Reliability Evaluation of Off-State Mode of MOSFETs in Ultrathin Gate OxidesErnest Wu; Edward Nowak20042004, vol.25, no.6
The Mechanism and Evaluation of Hot-Carrier-Induced Performance Degradation in 0.18-μm CMOS Image SensorT. H. Hsu; Y. K. Fang; D. N. Yaung; S. G. Wuu; H. C. Chien; C. S. Wang; J. S. Lin; C. H. Tseng; S. F. Chen; C. S. Lin; C. Y. Lin20042004, vol.25, no.6
Nonlocal Hot-Electron Injection as the Mechanism for the Predominant Source-Side Gate Oxide Degradation in CHE-Stressed Deep Submicrometer n-MOSFETsD. S. Ang; H. Liao; C. H. Ling20042004, vol.25, no.6
Silicon Film Thickness Optimization for SOI-DTMOS From Circuit Performance ConsiderationsBulusu Anand; M. P. Desai; Y. Ramgopal Rao20042004, vol.25, no.6
Silicon-Based Field-Induced Band-to-Band Tunneling Effect TransistorKyung Rok Kim; Dae Hwan Kim; Ki-Whan Song; Gwanghyeon Back; Hyun Ho Kim; Jung Im Huh; Jong Duk Lee; Byung-Gook Park20042004, vol.25, no.6
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