中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data CompressionLEI LI; KRISHNENDU CHAKRABARTY20042004, vol.20, no.6
Area Minimization of Exclusive-OR Intensive Circuits in FPGAsSEOK-BUM KO20042004, vol.20, no.6
Power-Driven Routing-Constrained Scan Chain DesignY. BONHOMME; P. GIRARD; L. GUILLER; C. LANDRAULT; S. PRAVOSSOUDOVITCH20042004, vol.20, no.6
Scan Test Strategy for Asynchronous-Synchronous InterfacesOCTAVIAN PETRE; HANS G. KERKHOFF20042004, vol.20, no.6
A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACsSUNIL RAFEEQUE, K. P.; VINITA VASUDEVAN20042004, vol.20, no.6
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BISTMICHAEL GOESSEL; KRISHNENDU CHAKRABARTY; VITALIJ OCHERETNIJ; ANDREAS LEININGER20042004, vol.20, no.6
Modeling Custom Digital Circuits for TestSOUMITRA BOSE20042004, vol.20, no.6
Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault SimulationZAINALABEDIN NAVABI; SHAHRZAD MIRKHANI; MEISAM LAVASANI; FABRIZIO LOMBARDI20042004, vol.20, no.6
Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring FeaturesAMIR RAJABZADEH; SEYED GHASSEM MIREMADI; MIRZAD MOHANDESPOUR20042004, vol.20, no.5
A Two-Level Power-Grid Model for Transient Current Testing EvaluationB. ALORDA; V. CANALS; J. SEGURA20042004, vol.20, no.5
12345



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2024