中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024


题名作者出版年年卷期
Design and Verification of a SAR ADC SystemVerilog Real Number ModelGeorgoulopoulos, Nikolaos; Mamali, Theodora; Hatzopoulos, Alkis20242024, vol.40, no.3
Formal Verification of Universal Numbers using Theorem ProvingRashid, Adnan; Gauhar, Ayesha; Hasan, Osman; Abed, Sa'ed; Ahmad, Imtiaz20242024, vol.40, no.3
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial ApproachGoudet, Esther; Sureau, Fabio; Breuil, Paul; Pena Trevino, Luis; Naviner, Lirida; Daveau, Jean-Marc; Roche, Philippe20242024, vol.40, no.3
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative DecisionPan, Yuqi; Liang, Huaguo; Li, Junming; Qu, Jinxing; Huang, Zhengfeng; Yi, Maoxiang; Lu, Yingchun20242024, vol.40, no.3
A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN TechniquesTamizharasi, A.; Ezhumalai, P.20242024, vol.40, no.3
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency SourceKumar, Vipin; Ghosh, Jayanta20242024, vol.40, no.3
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic AlgorithmChakraborty, Sandip; Ghosh, Archisman; Mondal, Anindan; Sen, Bibhash20242024, vol.40, no.3
The EditorialAgrawal, Vishwani D.20242024, vol.40, no.3
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop ApplicationPattanaik, Manisha; Srivastava, Pankaj; Ahirwar, Rachana20242024, vol.40, no.2
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal TransmissionCao, Rongxing; Liu, Yan; Cai, Yulong; Mei, Bo; Zhao, Lin; Tian, Jiayu; Cui, Shuai; Lv, He; Zeng, Xianghua; Xue, Yuxiong20242024, vol.40, no.2
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