中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter DeviationsS. J. SPINKS; C. D. CHALK; I. M. BELL; M. ZWOLINSKI20042004, vol.20, no.1
Classification of Defective Analog Integrated Circuits Using Artificial Neural NetworksV. STOPJAKOVA; P. MALOSEK; D. MICUSIK; M. MATEJ; M. MARGALA20042004, vol.20, no.1
Control and Observation Structure for Analog Circuits with Current Test DataCHUN-LUNG HSU20042004, vol.20, no.1
A Graph-Based Approach to Power-Constrained SOC Test SchedulingCHIH-PIN SU; CHENG-WEN WU20042004, vol.20, no.1
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power ConstraintsVALENTIN MURESAN; XIAOJUN WANG; VALENTINA MURESAN; MIRCEA VLADUTIU20042004, vol.20, no.1
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing TechniquesD. APPELLO; A. FUDOLI; V. TANCORRE20042004, vol.20, no.1
Testing and Reliability Techniques for High-Bandwidth Embedded RAMsKANAD CHAKRABORTY20042004, vol.20, no.1
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing CompactorO. NOVAK; Z. PLIVA; J. NOSEK; A. HLAWICZKA; T. GARBOLINO; K. GUCWA20042004, vol.20, no.1



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