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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
全部
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2004, vol.20, no.1
2004, vol.20, no.2
2004, vol.20, no.3
2004, vol.20, no.4
2004, vol.20, no.5
2004, vol.20, no.6
题名
作者
出版年
年卷期
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data
J. C. WANG; P. S. CARDOSO; J. A. Q. GONZALEZ; M. STRUM; R. PIRES
2004
2004, vol.20, no.4
On High-Quality, Low Energy Built-in Self Test Preparation at RT-Level
M. B. SANTOS; I. C. TEIXEIRA; J. P. TEIXEIRA; S. MANICH; L. BALADO; J. FIGUERAS
2004
2004, vol.20, no.4
Searching for Global Test Costs Optimization in Core-Based Systems
ERIKA COTA; LUIGI CARRO; MARCELO LUBASZEWSKI; ALEX ORAILOGLU
2004
2004, vol.20, no.4
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure
F. AZAIS; S. BERNARD; Y. BERTRAND; M. COMTE; M. RENOVELL
2004
2004, vol.20, no.4
Oscillation Test Strategy: A Case Study
EDUARDO ROMERO; GABRIELA PERETTI; CARLOS MARQUES
2004
2004, vol.20, no.4
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems
FABIAN VARGAS; RUBEM D. FAGUNDES; DANIEL BARROS, JR.; DIOGO B. BRUM; EDUARDO RHOD
2004
2004, vol.20, no.4
Simulating Single Event Transients in VDSM ICs for Ground
DAN ALEXANDRESCU; LORENA ANGHEL; MICHAEL NICOLAIDIS
2004
2004, vol.20, no.4
A New FPGA for DSP Applications Integrating BIST Capabilities
ALEX GONSALES; MICHEL RENOVELL; MARCELO LUBASZEWSKI; LUIGI CARRO
2004
2004, vol.20, no.4
A New Approach to Software-Implemented Fault Tolerance
M. REBAUDENGO; M. SONZA REORDA; M. VIOLANTE
2004
2004, vol.20, no.4
Mutation Analysis and Constraint-Based Criteria: Results from an Empirical Evaluation in the Context of Software Testing
INALI WISNIEWSKI SOARES; SILVIA REGINA VERGILIO
2004
2004, vol.20, no.4
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