中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2005, vol.26, no.1 2005, vol.26, no.10 2005, vol.26, no.11 2005, vol.26, no.12 2005, vol.26, no.2 2005, vol.26, no.3
2005, vol.26, no.4 2005, vol.26, no.5 2005, vol.26, no.6 2005, vol.26, no.7 2005, vol.26, no.8 2005, vol.26, no.9
2005, vol.26, no.9 2

题名作者出版年年卷期
Fabrication and Characterization of 100-nm In{sub}0.53Ga{sub}0.47As-In{sub}0.52Al{sub}0.48As Double-Gate HEMTs With Two Separate Gate ControlsN. Wichmann; I. Duszynski; X. Wallart; S. Bollaert; A. Cappy20052005, vol.26, no.9
10-GHz Power Performance of a Type II InP/GaAsSb DHBTDavid C. Caruth; Benjamin F. Chu-Kung; Milton Feng20052005, vol.26, no.9
Characteristics of Transistors Fabricated on Silicon-on-Quartz Prepared Using a Mechanically Initiated Exfoliation TechniqueXuejie Shi; K. Henttinen; T. Suni; I. Suni; Man Wong20052005, vol.26, no.9
Mechanism of Positive-Bias Temperature Instability in Sub-1-nm TaN/HfN/HfO{sub}2 Gate Stack With Low Preexisting TrapsN. Sa; J. F. Kang; H. Yang; X. Y. Liu; Y. D. He; R. Q. Han; C. Ren; H. Y. Yu; D. S. H. Chan; D.-L. Kwong20052005, vol.26, no.9
Investigation and Modeling of Stress Effects on the Formation of Cobalt SalicideY. L. Hsu; Y. K. Fang; S. J. Fang; Paul Chu; Yens Ho20052005, vol.26, no.9
Study of Ta-Barrier and Pore Sealing Dielectric Layer Interaction for Enhanced Barrier Performance of Cu/Ultralow K(K < 2.2) InterconnectsX. T. Chen; D. Gui; D. Z. Chi; W. D. Wang; N. Babu; N. Hwang; G. Q. Lo; R. Kumar; N. Balasubramanian; D.-L. Kwong20052005, vol.26, no.9
High-Performance Inductors on Plastic SubstrateL. H. Guo; Q. X. Zhang; G. Q. Lo; N. Balasubramanian; D.-L. Kwong20052005, vol.26, no.9
Temporary Extrusion Failures in Accelerated Lifetime Tests of Copper InterconnectsY. Zhang; J. H. Choy; G. H. Chapman; K. L. Kavanagh20052005, vol.26, no.9
Metal-Insulator-Metal RF Bypass Capacitor Using Niobium Oxide (Nb{sub}2O{sub}5) With HfO{sub}2/Al{sub}2O{sub}3 BarriersSun-Jung Kim; Byung Jin Cho; Ming Bin Yu; Ming-Fu Li; Yong-Zhong Xiong; Ghunxiang Zhu; Albert Chin; Dim-Lee Kwong20052005, vol.26, no.9
In{sub}0.5Ga{sub}0.5As/GaAs Quantum Dot Infrared Photodetectors Grown by Metal-Organic Chemical Vapor DepositionL. Fu; P. Lever; K. Sears; H. H. Tan; C. Jagadish20052005, vol.26, no.9
1234



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2024