中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2006, vol.27, no.1 2006, vol.27, no.10 2006, vol.27, no.11 2006, vol.27, no.12 2006, vol.27, no.2 2006, vol.27, no.3
2006, vol.27, no.4 2006, vol.27, no.5 2006, vol.27, no.6 2006, vol.27, no.7 2006, vol.27, no.8 2006, vol.27, no.9

题名作者出版年年卷期
Strained-SOI n-Channel Transistor With Silicon-Carbon Source/Drain Regions for Carrier Transport EnhancementKing-Jien Chui; Kah-Wee Ang; Hock-Chun Chin; Chen Shen; Lai-Yin Wong; Chih-Hang Tung; N. Balasubramanian; Ming Fu Li; Ganesh S. Samudra; Yee-Chia Yeo20062006, vol.27, no.9
Room-Temperature Low-Dimensional Effects in Pi-Gate SOI MOSFETsJ. P. Colinge; Weize Xiong; C. R. Cleavelin; T. Schulz; K. Schrufer; K. Matthews; P. Patruno20062006, vol.27, no.9
RF Split Capacitance-Voltage Measurements of Short-Channel and Leaky MOSFET DevicesE. San Andres; L. Pantisano; J. Ramos; S. Severi; L. Trojman; S. De Gendt; G. Groeseneken20062006, vol.27, no.9
Drive-Current Enhancement in FinFETs Using Gate-Induced StressKian-Ming Tan; Tsung-Yang Liow; Rinus T. P. Lee; Chih-Hang Tung; Ganesh S. Samudra; Won-Jong Yoo; Yee-Chia Yeo20062006, vol.27, no.9
Random Telegraph Signal Noise in Gate-All-Around Si-FinFET With Ultranarrow BodyY. F. Lim; Y. Z. Xiong; N. Singh; R. Yang; Y. Jiang; D. S. H. Chan; W. Y. Loh; L. K. Bera; G. Q. Lo; N. Balasubramanian; D.-L. Kwong20062006, vol.27, no.9
HfSiON n-MOSFETs Using Low-Work Function HfSi{sub}x GateC. H. Wu; B. F. Hung; Albert Chin; S. J. Wang; F. Y. Yen; Y. T. Hou; Y. Jin; H. J. Tao; S. C. Chen; M. S. Liang20062006, vol.27, no.9
Simulation Study of High-Performance Modified Saddle MOSFET for Sub-50-nm DRAM Cell TransistorsKi-Heung Park; Kyoung-Rok Han; Young Min Kim; Jong-Ho Lee20062006, vol.27, no.9
Insight Into the Suppressed Recovery of NBTI-Stressed Ultrathin Oxynitride Gate pMOSFETD. S. Ang; S. Wang20062006, vol.27, no.9
Temperature-Compensated Devices Using Thin TeO{sub}2 Layer With Negative TCDNamrata Dewan; K. Sreenivas; Vinay Gupta20062006, vol.27, no.9
Enhanced Band-to-Band-Tunneling-Induced Hot-Electron Injection in p-Channel Flash by Band-gap Offset ModificationChi-Chao Wang; Kuei-Shu Chang-Liao; Chun-Yuan Lu; Tien-Ko Wang20062006, vol.27, no.9
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