中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2006, vol.27, no.1 2006, vol.27, no.10 2006, vol.27, no.11 2006, vol.27, no.12 2006, vol.27, no.2 2006, vol.27, no.3
2006, vol.27, no.4 2006, vol.27, no.5 2006, vol.27, no.6 2006, vol.27, no.7 2006, vol.27, no.8 2006, vol.27, no.9

题名作者出版年年卷期
Surface Leakage Currents in SiN{sub}x Passivated AlGaN/GaN HFETsW. S. Tan; M. J. Uren; P. A. Houston; R. T. Green; R. S. Balmer; T. Martin20062006, vol.27, no.1
Thermally Stable Ge/Ag/Ni Ohmic Contact for InAlAs/InGaAs/InP HEMTsWeifeng Zhao; Seiyon Kim; Jian Zhang; Ilesanmi Adesida20062006, vol.27, no.1
Output Power Density of 5.1/mm at 18 GHz With an AlGaN/GaN HEMT on Si SubstrateD. Ducatteau; A. Minko; V. Hoel; E. Morvan; E. Delos; B. Grimbert; H. Lahreche; P. Bove; C. Gaquiere; J. C. De Jaeger; S. Delage20062006, vol.27, no.1
AlGaN/GaN/InGaN/GaN DH-HEMTs With an InGaN Notch for Enhanced Carrier ConfinementJie Liu; Yugang Zhou; Jia Zhu; Kei May Lau; Kevin J. Chen20062006, vol.27, no.1
AlGaN/GaN High Electron Mobility Transistors With InGaN Back-BarriersT. Palacios; A. Chakraborty; S. Heikman; S. Keller; S. P. DenBaars; U. K. Mishra20062006, vol.27, no.1
AlGaN/GaN MIS-HFETs With f{sub}T of 163 GHz Using Cat-CVD SiN Gate-Insulating and Passivation LayersMasataka Higashiwaki; Toshiaki Matsui; Takashi Mimura20062006, vol.27, no.1
The Effect of Gate Leakage on the Noise Figure of AlGaN/GaN HEMTsChris Sanabria; Arpan Chakraborty; Hongtao Xu; Mark J. Rodwell; Umesh K. Mishra; Robert A. York20062006, vol.27, no.1
Low-Resistance Ohmic Contacts to Digital Alloys of n-AlGaN/AlNJ. Yun; K. Choi; K. Mathur; V. Kuryatkov; B. Borisov; G. Kipshidze; S. Nikishin; H. Temkin20062006, vol.27, no.1
Kirk Effect in Bipolar Transistors With a Nonuniform Dopant Profile in the CollectorD. Cohen Elias; D. Ritter20062006, vol.27, no.1
High-Performance 94-GHz Single Balanced Mixer Using 70-nm MHEMTs and Surface Micromachined TechnologySung Chan Kim; Dan An; Byeong Ok Lim; Tae Jong Back; Dong Hoon Shin; Jin Koo Rhee20062006, vol.27, no.1
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