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期刊
ISSN
0741-3106
刊名
IEEE Electron Device Letters
参考译名
IEEE电子器件快报
收藏年代
1998~2007
全部
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2007
2007, vol.28, no.1
2007, vol.28, no.10
2007, vol.28, no.11
2007, vol.28, no.12
2007, vol.28, no.2
2007, vol.28, no.3
2007, vol.28, no.4
2007, vol.28, no.5
2007, vol.28, no.6
2007, vol.28, no.7
2007, vol.28, no.8
2007, vol.28, no.9
题名
作者
出版年
年卷期
Investigation of Impact Ionization in InAs-Channel HEMT for High-Speed and Low-Power Applications
Chia-Yuan Chang; Heng-Tung Hsu; Edward Yi Chang; Chien-I Kuo; Suman Datta; Marko Radosavljevic; Yasuyuki Miyamoto; Guo-Wei Huang
2007
2007, vol.28, no.10
Solution-Processed n-Type Organic Field-Effect Transistors With High ON/OFF Current Ratios Based on Fullerene Derivatives
S. P. Tiwari; E. B. Namdas; V. Ramgopal Rao; D. Fichou; S. G. Mhaisalkar
2007
2007, vol.28, no.10
GaN-Based High-Q Vertical-Cavity Light-Emitting Diodes
Tien-Chang Lu; Tsung-Ting Kao; Chih-Chiang Kao; Jung-Tang Chu; Kang-Fan Yeh; Li-Fan Lin; Yu-Chun Peng; Hung-Wen Huang; Hao-Chung Kuo; Shing-Chung Wang
2007
2007, vol.28, no.10
A Simple and Effective Approach to Improve the Output Linearity of Switched-Current AMOLED Pixel Circuitry
Xiaojun Guo; S. R. P. Silva
2007
2007, vol.28, no.10
Solution-Processed TIPS-Pentacene Organic Thin-Film-Transistor Circuits
Sung Kyu Park; John E. Anthony; Thomas N. Jackson
2007
2007, vol.28, no.10
Enhanced Thermal Efficiency in Phase-Change Memory Cell by Double GST Thermally Confined Structure
Der-Sheng Chao; Yi-Chan Chen; Fred Chen; Ming-Jung Chen; Philip H. Yen; Chain-Ming Lee; Wei-Su Chen; Chenhsin Lien; Ming-Jer Kao; Ming-Jinn Tsai
2007
2007, vol.28, no.10
Constant Bias Stress Effects on Threshold Voltage of Pentacene Thin-Film Transistors Employing Polyvinylphenol Gate Dielectric
Tae Ho Kim; Chung Kun Song; Jin Seong Park; Min Chul Sun
2007
2007, vol.28, no.10
Anomalous Cells With Low Reset Resistance in Phase-Change-Memory Arrays
Davide Mantegazza; Daniele Ielmini; Agostino Pirovano; Andrea L. Lacaita
2007
2007, vol.28, no.10
A Wide Dynamic-Range CMOS Image Sensor Using Self-Reset Technique
Dongwon Park; Jehyuk Rhee; Youngjoong Joo
2007
2007, vol.28, no.10
Reduction of Threshold Voltage by Diffusion Control Technique in p-MISFETs Using Poly-Si/TiN/HfSiON Gate Stacks
Takaaki Kawahara; Yukio Nishida; Shinsuke Sakashita; Masaharu Mizutani; Masao Inoue; Shinichi Yamanari; Masahiko Higashi; Takashi Hayashi; Naofumi Murata; Kazuhito Honda; Jiro Yugami; Hidefumi Yoshimura; Masahiro Yoneda
2007
2007, vol.28, no.10
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