中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2007, vol.28, no.1 2007, vol.28, no.10 2007, vol.28, no.11 2007, vol.28, no.12 2007, vol.28, no.2 2007, vol.28, no.3
2007, vol.28, no.4 2007, vol.28, no.5 2007, vol.28, no.6 2007, vol.28, no.7 2007, vol.28, no.8 2007, vol.28, no.9

题名作者出版年年卷期
Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/decWoo Young Choi; Byung-Gook Park; Jong Duk Lee; Tsu-Jae King Liu20072007, vol.28, no.8
Low-Temperature Polymer-Based Three-Dimensional Silicon IntegrationSang K. Kim; Lei Xue; Sandip Tiwari20072007, vol.28, no.8
Defect Passivation by Selenium-Ion Implantation for Poly-Si Thin Film TransistorsJoanna Lai; Tsu-Jae King Liu20072007, vol.28, no.8
Sub-0.1-eV Effective Schottky-Barrier Height for NiSi on n-Type Si (100) Using Antimony SegregationHoong-Shing Wong; Lap Chan; Ganesh Samudra; Yee-Chia Yeo20072007, vol.28, no.8
An Efficient Macromodeling Approach for Simulating Carbon-Nanotube Field-Emission Triode Devices in Display ApplicationsXiaojun Guo; S. R. P. Silva20072007, vol.28, no.8
Amorphous-SiCBN-Based Metal-Semiconductor-Metal Photodetector for High-Temperature ApplicationsArun Vijayakumar; Ravi M. Todi; Kalpathy B. Sundaram20072007, vol.28, no.8
SiGe-Channel Confinement Effects for Short-Channel PFETs With Nonbandedge Gate WorkfunctionsB. Winstead; W. J. Taylor; E. Verret; K. Loiko; D. Tekleab; C. Capasso; M. Foisy; S. B. Samavedam20072007, vol.28, no.8
High-Performance Polycrystalline-Silicon TFT by Heat-Retaining Enhanced Lateral CrystallizationPo-Tsun Liu; Hsing-Hua Wu20072007, vol.28, no.8
Numerical Simulation of Low-Frequency Noise in Polysilicon Thin-Film TransistorsL. Pichon; A. Boukhenoufa; C. Cordier; B. Cretu20072007, vol.28, no.8
Analysis of Temperature in Phase Change Memory ScalingSangBum Kim; H.-S. Philip Wong20072007, vol.28, no.8
1234



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2026