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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：电子装置
收藏年代2000～2024

关联期刊参考译名收藏年代
電子情報通信学会技術研究報告电子信息通信学会技术研究报告：电子装置 


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2007, vol.107, no.110 2007, vol.107, no.177 2007, vol.107, no.355 2007, vol.107, no.420 2007, vol.107, no.473 2007, vol.107, no.54
2007, vol.107, no.95

题名作者出版年年卷期
Mechanical Stress Issues in Semiconductor TechnologyJae Hoon CHOI20072007, vol.107, no.110
Robust Design of Transistors: Present Status and Measures to Characteristic VariationsToshiro HIRAMOTO20072007, vol.107, no.110
FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETsHochul Lee; Youngchang Yoon; Hyungcheol Shin20072007, vol.107, no.110
A design of temperature-compensated complementary metal-oxide semiconductor voltage reference sources with a small temperature coefficientKyung Soo Park; Sun Bo Woo; Kae Dal Kwack; Tae Whan Kim20072007, vol.107, no.110
Low Cost CMOS LNA Design Using Thin-Metal CMOS ProcessHee-Sauk Jhon; Ickhyun Song; Yeo-nam Yoon; Hyungcheol Shin20072007, vol.107, no.110
Stress Effect Analysis for PD-SOI pMOSFETs with Undoped-Si{sub}0.88Ge{sub}0.12 Heterostructure ChannelSang-Sik Choi; A-Ram Choi; Jae-Yeon Kim; Jeon-Wook Yang; Yong-Woo Hwang; Tae-Hyun Han; Deok Ho Cho; Kyu-Hwan Shim20072007, vol.107, no.110
CMOS Low-Noise Amplifier with Noise Suppression Technique from Gate ResistanceIckhyun Song; Min Suk Koo; Hee Sauk Jhon; Hyungcheol Shin20072007, vol.107, no.110
Quantum-Mechanical Effects in Nanometer Scale MuGFETsSe Re Na Yun; Chong Gun Yu; Jong Tae Park; Jean Pierre Colinge20072007, vol.107, no.110
RF Characteristics for 70 nm MOSFETs below 77 KSeung-Ho Hong; Gil-Bok Choi; Rock-Hyun Baek; Hee-Sung Kang; Sung-Woo Jung; Yoon-Ha Jeong20072007, vol.107, no.110
Selective Epitaxial Growth of SiGe Layers with High Aspect Ratio Mask of Dielectric FilmsA-Ram Choi; Sang-Sik Choi; Byung-Guan Park; Dongwoo Suh; Gyungock Kim; Jin-Tae Kim; Jin-Soo Choi; Deok-Ho Cho; Tae-Hyun Han; Kyu-Hwan Shim20072007, vol.107, no.110
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