中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
A New Design-for-Testability Method Based on Thru-TestabilityChia Yee Ooi; Hideo Fujiwara20112011, vol.27, no.5
Fault Diagnosis with Orthogonal Compactors in Scan-Based DesignsBrady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer20112011, vol.27, no.5
Wavelet Neural Network Approach for Testing of Switched-Current CircuitsGuo Jierong; He Yigang; Liu Meirong20112011, vol.27, no.5
Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection PredictionsGilles Foucard; Paul Peronnard; Raoul Velazco20112011, vol.27, no.5
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and RoutersMarcos Barcellos Herve; Marcelo Moraes; Pedro Almeida; Marcelo Lubaszewski; Fernanda Lima Kastensmidt; Erika Cota20112011, vol.27, no.5
A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnectZhu Jianfeng; He Hu; Wu Dong; Pan Liyang20112011, vol.27, no.5
Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization TechniquesDebasis Mitra; Sarmishtha Ghoshal; Hafizur Rahaman; Krishnendu Chakrabarty; Bhargab B. Bhattacharya20112011, vol.27, no.5
Analog Circuit Fault Detection Using Location of PolesAshok Kavithamani; Venugopal Manikandan; Nanjundappan Devarajan20112011, vol.27, no.5



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