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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
Analyzing Vulnerability of Asynchronous Pipeline to Soft Errors: Leveraging Formal VerificationLodhi, Faiq Khalid; Hasan, Syed Rafay; Hasan, Osman; Awwad, Falah20162016, vol.32, no.5
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay TestingShintani, Michihiro; Uezono, Takumi; Hatayama, Kazumi; Masu, Kazuya; Sato, Takashi20162016, vol.32, no.5
A Comprehensive FPGA-Based Assessment on Fault-Resistant AES against Correlation Power Analysis AttackDofe, Jaya; Pahlevanzadeh, Hoda; Yu, Qiaoyan20162016, vol.32, no.5
CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern GeneratorYeh, Kuen-Wei; Huang, Jiun-Lang; Wang, Laung-Terng20162016, vol.32, no.5
Test Data Compression for System-on-chip using Flexible Runs-aware PRL CodingYuan, Haiying; Ju, Zijian; Sun, Xun; Guo, Kun; Wang, Xiuyu20162016, vol.32, no.5
A Novel Compact Model for On-Chip Vertically-Coiled Spiral InductorsLiu, Tong; Liu, Jun; Chen, Junli; Yu, Faxin; Wang, Wenbo; Hou, Bing20162016, vol.32, no.5
UntitledAgrawal, Vishwani D.20162016, vol.32, no.5
Optimization of Test Wrapper for TSV Based 3D SOCsRahaman, Hafizur; Roy, Surajit Kumar; Giri, Chandan20162016, vol.32, no.5
A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSOZhang, Chaolong; He, Yigang; Yuan, Lifen; He, Wei; Xiang, Sheng; Li, Zhigang20162016, vol.32, no.5
Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUTKumar, T. Nandha; Almurib, Haider A. F.; Lombardi, Fabrizio20162016, vol.32, no.5
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