中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.2
Handling Unknown with Blend of Scan and Scan CompressionPralhadrao V. Shantagiri; Rohit Kapur20182018, vol.34, no.2
EditorialVishwani D. Agrawal20182018, vol.34, no.2
Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular CavityYong Gao; En Li; Gaofeng Guo20182018, vol.34, no.2
The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular AutomataMengbo Sun; Hongjun Lv; Yongqiang Zhang; Guangjun Xie20182018, vol.34, no.2
Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer EnvironmentNaoki Terao; Toru Nakura; Masahiro Ishida; Rimon Ikeno; Takashi Kusaka; Tetsuya Iizuka; Kunihiro Asada20182018, vol.34, no.2
Detectability Challenges of Bridge Defects in FinFET Based Logic CellsFreddy Forero; Jean-Marc Galliere; Michel Renovell; Victor Champac20182018, vol.34, no.2
Application of Machine Learning Techniques in Post-Silicon Debugging and Bug LocalizationEman El Mandouh; Amr G. Wassal20182018, vol.34, no.2
Machine Learning for Hardware Security: Opportunities and RisksRana Elnaggar; Krishnendu Chakrabarty20182018, vol.34, no.2



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2024