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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
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2018, vol.34, no.1
2018, vol.34, no.2
2018, vol.34, no.3
2018, vol.34, no.4
2018, vol.34, no.5
2018, vol.34, no.6
题名
作者
出版年
年卷期
Test Technology Newsletter
2018
2018, vol.34, no.3
Digital Predistortion for Spectrum Compliance in the Internet of Things
Siyuan Yan; Xiao Li; Changhong Jiang; Hui Li; Lingmei Wang; Fu Li
2018
2018, vol.34, no.3
Reliability Testing of 3D-Printed Electromechanical Scanning Devices
B. Mert G?nülta?; Janset Sava?; Ramin Khayatzadeh; Sacid Aygün; Fehmi ?ivitci; Y. Da?han G?kdel; M. Berke Yelten; Onur Ferhano?lu
2018
2018, vol.34, no.3
Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications
Hani Malloug; Manuel J. Barragan; Salvador Mir
2018
2018, vol.34, no.3
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal
Peter Sarson; Tomonori Yanagida; Kosuke Machida
2018
2018, vol.34, no.3
Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis
Yang Zhang; Houde Quan; Xiongwei Li; Kaiyan Chen
2018
2018, vol.34, no.3
Gate Oxide Short Defect Model in FinFETs
Roya Dibaj; Dhamin Al-Khalili; Maitham Shams
2018
2018, vol.34, no.3
Editorial
Vishwani D. Agrawal
2018
2018, vol.34, no.3
Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
Ke Huang; Manuel J. Barragan
2018
2018, vol.34, no.3
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment
Peter Sarson; Tomonori Yanagida; Shohei Shibuya; Kosuke Machida; Haruo Kobayashi
2018
2018, vol.34, no.3
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