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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
EditorialVishwani D. Agrawal20182018, vol.34, no.4
Test Technology Newsletter 20182018, vol.34, no.4
Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-FlopsRiadul Islam20182018, vol.34, no.4
Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test PartitionYing Zhang; Li Ling; Jianhui Jiang; Jie Xiao20182018, vol.34, no.4
Test and Reliability in Approximate ComputingLorena Anghel; Mounir Benabdenbi; Alberto Bosio; Marcello Traiola; Elena Ioana Vatajelu20182018, vol.34, no.4
An Extensible Code for Correcting Multiple Cell Upset in Memory ArraysFelipe Silva; Jardel Silveira; Jarbas Silveira; César Marcon; Fabian Vargas; Otávio Lima20182018, vol.34, no.4
Address Remapping Techniques for Enhancing Fabrication Yield of Embedded MemoriesShyue-Kung Lu; Hao-Cheng Jheng; Hao-Wei Lin; Masaki Hashizume20182018, vol.34, no.4
Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout RegulatorsAydin Dirican; Cagatay Ozmen; Martin Margala20182018, vol.34, no.4
Fault Tolerance Mechanisms for FPGA-Based Regular Expression MatchingMarcos T. Leipnitz; Gabriel L. Nazar20182018, vol.34, no.4
Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic TestingM. A. Nourian; M. Fazeli; D. Hely20182018, vol.34, no.4
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