中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2018 2019 2020 2021 2022 2023
2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20182018, vol.34, no.5
An Efficient SAT-Based Test Generation Algorithm with GPU AcceleratorOsama, Muhammad; Gaber, Lamya; Hussein, Aziza I.; Mahmoud, Hanafy20182018, vol.34, no.5
Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power SystemZhang, Shigang; Wang, Long; Liu, Ying; Zhang, Xiaofei; Yang, Yongmin20182018, vol.34, no.5
Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMPChepelev, Vladimir; Parfenov, Yury; Radasky, William; Titov, Boris; Zdoukhov, Leonid; Li, Kejie; Chen, Yuhao; Kong, Xu; Xie, Yan-zhao20182018, vol.34, no.5
Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoTYu, Weize; Wen, Yiming; Koese, Selcuk; Chen, Jia20182018, vol.34, no.5
High Performance Modified Static Segment Approximate Multiplier based on Significance ProbabilityVasanthanayaki, C.; Jothin, R.20182018, vol.34, no.5
Analytical Low Frequency NBTI Compact Modeling with H-2 Locking and Electron Fast Capture and EmissionQing, J.; Zeng, Y.; Li, X. J.; Zhang, P. J.; Sun, Y. B.; Shi, Y. L.20182018, vol.34, no.5
Impact of Aging on the Reliability of Delay PUFsKarimi, Naghmeh; Danger, Jean-Luc; Guilley, Sylvain20182018, vol.34, no.5
Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash MemoriesLu, Shyue-Kung; Zhong, Shang-Xiu; Hashizume, Masaki20182018, vol.34, no.5



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