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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
全部
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2024
2020, vol.36, no.1
2020, vol.36, no.2
2020, vol.36, no.3
2020, vol.36, no.4
2020, vol.36, no.5
2020, vol.36, no.6
题名
作者
出版年
年卷期
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter
Rathnapriya, S.; Manikandan, V.
2020
2020, vol.36, no.2
A Novel Approach of Data Content Zeroization Under Memory Attacks
Srivastava, Ankush; Ghosh, Prokash
2020
2020, vol.36, no.2
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects
Copetti, T.; Balen, T. R.; Brum, E.; Aquistapace, C.; Bolzani Poehls, L.
2020
2020, vol.36, no.2
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications
Shah, Ambika Prasad; Vishvakarma, Santosh Kumar; Huebner, Michael
2020
2020, vol.36, no.2
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films
Ge, Jinqun; Xia, Tian; Wang, Guoan
2020
2020, vol.36, no.2
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips
Huang, Xijun; Xu, Chuanpei; Zhang, Long
2020
2020, vol.36, no.2
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits
El Badawi, H.; Azais, Florence; Bernard, S.; Comte, M.; Kerzerho, V; Lefevre, F.
2020
2020, vol.36, no.2
Speed-Up in Test Methods Using Probabilistic Merit Indicators
Fooladi, Mahtab; Kamran, Arezoo
2020
2020, vol.36, no.2
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs
Kaibartta, Tanusree; Biswas, G. P.; Das, Debesh Kumar
2020
2020, vol.36, no.2
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification
Sharma, Gaurav; Bhargava, Lava; Kumar, Vinod
2020
2020, vol.36, no.2
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