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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
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2021, vol.37, no.1
2021, vol.37, no.2
2021, vol.37, no.3
2021, vol.37, no.4
2021, vol.37, no.5/6
题名
作者
出版年
年卷期
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model
Wang, Mengru; Wang, Jinbo; Wang, Jianmin; Zhou, Shan
2021
2021, vol.37, no.1
Estimating Operational Age of an Integrated Circuit
Chowdhury, Prattay; Guin, Ujjwal; Singh, Adit D.; Agrawal, Vishwani D.
2021
2021, vol.37, no.1
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets
Ghosh, Sourav; Roy, Surajit Kumar; Giri, Chandan
2021
2021, vol.37, no.1
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems
Deyati, Sabyasachi; Muldrey, Barry J.; Singh, Adit D.; Chatterjee, Abhijit
2021
2021, vol.37, no.1
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm
Pandaram, Karthik; Rathnapriya, S.; Manikandan, V.
2021
2021, vol.37, no.1
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure
Huang, Xijun; Xu, Chuanpei; Zhang, Long
2021
2021, vol.37, no.1
Model Transferability from ImageNet to Lithography Hotspot Detection
Xiao, Yindong; Huang, Xueqian; Liu, Ke
2021
2021, vol.37, no.1
Editorial
Agrawal, Vishwani D.
2021
2021, vol.37, no.1
Pre-Silicon Verification Using Multi-FPGA Platforms: A Review
Farooq, Umer; Mehrez, Habib
2021
2021, vol.37, no.1
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip
Mitra, Partha; Bhaumik, Jaydeb; Sarkar, Angsuman
2021
2021, vol.37, no.1
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