中国机械工程学会生产工程分会知识服务平台
主页
文献资源
外文期刊
外文会议
中文期刊
专业机构
生产工程
智能制造
高级检索
关于我们
版权声明
使用帮助
期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
全部
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
2021, vol.37, no.1
2021, vol.37, no.2
2021, vol.37, no.3
2021, vol.37, no.4
2021, vol.37, no.5/6
题名
作者
出版年
年卷期
Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method
Loh, Felix; Saluja, Kewal K.; Ramanathan, Parameswaran
2021
2021, vol.37, no.3
A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes
Bai, Yonghong; Yan, Zhiyuan
2021
2021, vol.37, no.3
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects
Copetti, Thiago; Cardoso Medeiros, Guilherme; Taouil, Mottaqiallah; Hamdioui, Said; Bolzani Poehls, Leticia; Balen, Tiago
2021
2021, vol.37, no.3
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs
Gonzalez, Carlos J.; Costa, Bruno L.; Machado, Diego N.; Vaz, Rafael G.; Boas, Alexis C. Vilas; Goncalez, Odair L.; Puchner, Helmut; Kastensmidt, Fernanda L.; Medina, Nilberto H.; Guazzelli, Marcilei A.; Balen, Tiago R.
2021
2021, vol.37, no.3
Hardware Trojan Free Netlist Identification: A Clustering Approach
Mondal, Anindan; Biswal, Rajesh Kumar; Mahalat, Mahabub Hasan; Roy, Suchismita; Sen, Bibhash
2021
2021, vol.37, no.3
A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula
Taali, M.; Shirmohammadi, Z.
2021
2021, vol.37, no.3
Spectrum Analyzer Based on a Dynamic Filter
Herasimov, S.; Borysenko, M.; Roshchupkin, E.; Hrabchak, V., I; Nastishin, Yu A.
2021
2021, vol.37, no.3
Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice
Kabin, Ievgen; Dyka, Zoya; Klann, Dan; Aftowicz, Marcin; Langendoerfer, Peter
2021
2021, vol.37, no.3
Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors
Boukhari, M. I.; Oumar, D. A.; Capraro, S.; Pietroy, D.; Chatelon, J. P.; Rousseau, J. J.
2021
2021, vol.37, no.3
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell
Champac, Victor; Mesalles, Javier; Villacorta, Hector; Vargas, Fabian
2021
2021, vol.37, no.3
国家科技图书文献中心
全球文献资源网
京ICP备05055788号-26
京公网安备11010202008970号 机械工业信息研究院 2018-2024