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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2018 2019 2020 2021 2022 2023
2024

2024, vol.40, no.1 2024, vol.40, no.2

题名作者出版年年卷期
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened LatchesXu Hui; Qin Xuewei; Ma Ruijun; Liu Chaoming; Zhu Shuo; Wang Jun; Liang Huaguo20242024, vol.40, no.1
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled ElementsLi Zishuai; Sun Liting; Liang Huaguo; Ni Tianming; Yan Aibin; Huang Zhengfeng20242024, vol.40, no.1
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting SchemeYang Shun-Hua; Huang Shi-Yu20242024, vol.40, no.1
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random VibrationYu Shifeng; Dai Junjie; Li Junhui20242024, vol.40, no.1
Analysis of the Lifecycles of Automotive Resistor Lead in Random VibrationLinsen Huang20242024, vol.40, no.1
Design and Verification of an Asynchronous NoC Router Architecture for GALS SystemsSaranya M. N.; Rao Rathnamala20242024, vol.40, no.1
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process VariationsChampac Victor; Villacorta Hector; Gomez-Fuentes R.; Vargas Fabian; Segura Jaume20242024, vol.40, no.1
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault DiagnosisShang Yuling; Wei Songyi; Li Chunquan; Ye Xiaojing; Zeng Lizhen; Hu Wei; He Xiang; Zhou Jinzhuo20242024, vol.40, no.1
2023 JETTA Reviewers 20242024, vol.40, no.1
EditorialAgrawal Vishwani D.20242024, vol.40, no.1
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