中国机械工程学会生产工程分会知识服务平台

期刊


ISSN0547-051X
刊名NEC Research & Development
参考译名日本电气公司研究与发展
收藏年代1999～2003

关联期刊参考译名收藏年代
NEC Technical Journal日本电气公司技报2006～2009
NEC Journal of Advanced Technology日本电气公司研究与发展2004～2005


全部

1999 2000 2001 2002 2003

2000, vol.41, no.1 2000, vol.41, no.2 2000, vol.41, no.3 2000, vol.41, no.4

题名作者出版年年卷期
WebComputingOperationManager for integrated network and system managementTomoo Fujita20002000, vol.41, no.4
The i-OpenDiosa drives to integrate a mission critical system for internet business based on J2EEShuji Ohno; Hidechika Aono; Takahiro Ohkura; Kazuyuki Muramoto; Yoji Hatano; Yurui Tomimasu20002000, vol.41, no.4
The charge and behavior of flaked particles in tungsten dry etching equipment examined by using particle radarNatsuko Ito; Tsuyoshi Moriya; Fumihiko Uesugi; Yuji Hayashi; Koji Okamura20002000, vol.41, no.4
Special issue on technology supporting semiconductor scientific manufacturing -- process monitoring, testing, failure analysis and reliabilityTohru Tsujide20002000, vol.41, no.4
Simplified monitoring technique for line-short defects that provides high sensitivity and throughputHiroaki Kikuchi; Noriyuki Kodama; Naoharu Nishio; Noriaki Oda20002000, vol.41, no.4
Nanometer-scale imaging of crystal structural information by Fourier transform mappingTakashi Ide20002000, vol.41, no.4
LSI testing technique with I{sub}(DD) spectrum method: application to practical production linesKazuhiro Sakaguchi20002000, vol.41, no.4
In-line contact and via hole monitoring method using electron-beam-induced substrate current (EB scope)Keizo Yamada20002000, vol.41, no.4
Hot electron characterization in Si-MOSFETsToshitsugu Sakamoto; Hisao Kawaura; Toshio Baba; Takahiro Iizuka20002000, vol.41, no.4
High-availability laser-sized open OLTP systemHitoshi Uchida; Tadashi Miyazawa; Yoshie Sakabe20002000, vol.41, no.4
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