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期刊
ISSN
0018-9219
刊名
Proceedings of the IEEE
参考译名
电气与电子工程师学会会报
收藏年代
1998~2013
全部
1998
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2000
2001
2002
2003
2004
2005
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2001, vol.89, no.10
2001, vol.89, no.11
2001, vol.89, no.12
2001, vol.89, no.2
2001, vol.89, no.3
2001, vol.89, no.4
2001, vol.89, no.5
2001, vol.89, no.6
2001, vol.89, no.7
2001, vol.89, no.8
2001, vol.89, no.9
题名
作者
出版年
年卷期
Fundamental limits of silicon technology
Robert W. Keyes
2001
2001, vol.89, no.3
Material and process limits in silicon VLSI technology
James D. Plummer; Peter B. Griffin
2001
2001, vol.89, no.3
Device scaling limits of Si MOSFETs and their application dependencies
David J. Frank; Robert H. Dennard; Edward Nowak; Paul M. Solomon; Yuan Taur; Hon-Sum Philip Wong
2001
2001, vol.89, no.3
Analog at milepost 2000: a personal perspective
Barrie Gilbert
2001
2001, vol.89, no.3
Interconnect limits on gigascale integration (GSI) in the 21st century
Jeffrey A. Davis; Raguraman Venkatesan; Alain Kaloyeros; Michael Beylansky; Shukri J. Souri; Kaustav Banerjee; Krishna C. Saraswat; Arifur Rahman; Rafael Reif; James D. Meindl
2001
2001, vol.89, no.3
Coming challenges in microarchitecture and architecture
Ronny Ronen; Avi Mendelson; Konrad Lai; Shih-Lien Lu; Fred Pollack; John P. Shen
2001
2001, vol.89, no.3
Limitations and challenges of computer-aided design technology for CMOS VLSI
Randal E. Bryant; Kwang-Ting Cheng; Andrew B. Kahng; Kurt Keutzer; Wojciech Maly; Richard Newton; Lawrence Pileggi; Jan M. Rabaey; Alberto Sangiovanni-Vincentelli
2001
2001, vol.89, no.3
Limits of lithography
Lloyd R. Harriott
2001
2001, vol.89, no.3
Limits of integrated-circuit manufacturing
Robert Doering; Yoshio Nishi
2001
2001, vol.89, no.3
New paradigm of silicon technology
Tadahiro Ohmi; Shigetoshi Sugawa; Koji Kotani; Masaki Hirayama; Akihiro Morimoto
2001
2001, vol.89, no.3
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