中国机械工程学会生产工程分会知识服务平台

期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2008, vol.37, no.1 2008, vol.37, no.2 2008, vol.37, no.3 2008, vol.37, no.4 2008, vol.37, no.5 2008, vol.37, no.6

题名作者出版年年卷期
Radiation Effects in a BiCMOS LSI Interface TransceiverA. I. Belous; Yu. V. Bogatyrev; F. P. Korshunov; A. S. Artamonov; S. V. Shvedov20082008, vol.37, no.2
New Approach to the Mathematical Modeling of Thermal Regimes for Electronic EquipmentG. V. Kuznetsov; M. A. Sheremet20082008, vol.37, no.2
Microwave Method for SOS Quality TestingP. A. Borodovskii; A. F. Buldygin; N. I. Peturov; S. N. Rechkunov; V. A. Samoilov20082008, vol.37, no.2
Silicon Readout ICs for Third-Generation 2D IR Focal-Plane Arrays Operating over the Wavelength Range 8-12 μmI. I. Lee20082008, vol.37, no.2
Flip-Chip Bump-Lead Fabrication: A ReviewV. V. Zenin; E. P. Novokreshchenova; O. V. Khishko20082008, vol.37, no.2
Diluted Magnetic Semiconductors: Actual Structure and Magnetic and Transport PropertiesM. A. Chuev; B. A. Aronzon; E. M. Pashaev; M. V. Koval'chuk; I. A. Subbotin; V. V. Rylkov; V. V. Kvardakov; P. G. Medvedev; B. N. Zvonkov; O. V. Vikhrova20082008, vol.37, no.2
Achieving Sub-1.6-nm Resolutions of a Low-Voltage Microscopic Focused-Ion-Beam System Not Involving Aberration CorrectionV. A. Zhukov20082008, vol.37, no.2



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024